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Checking layout integrity
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Bipolar transistor comprising a raised collector pedestal for reduced capacitance
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Methods for normalizing strain in semicondcutor devices and strain normalized semiconductor devices
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Year of Publication 14.07.2015
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METHODS FOR NORMALIZING STRAIN IN SEMICONDCUTOR DEVICES AND STRAIN NORMALIZED SEMICONDUCTOR DEVICES
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Year of Publication 07.02.2013
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Methods for normalizing strain in semiconductor devices and strain normalized semiconductor devices
Balch, Bruce, Bernstein, Kerry, Ellis-Monaghan, John Joseph, Habib, Nazmul
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Year of Publication 30.10.2012
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Methods for normalizing strain in semiconductor devices and strain normalized semiconductor devices
ELLIS-MONAGHAN JOHN JOSEPH, BERNSTEIN KERRY, HABIB NAZMUL, BALCH BRUCE
Year of Publication 30.10.2012
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Year of Publication 30.10.2012
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