An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology
Oh, Sangmin, Jeong, Taeyoung, Yum, Junghwan, Lim, Minhyuk, Kim, Yoohwan, Jeong, Bongyong, Jo, Jeongmin, Shim, Hyewon, Chung, Shinyoung, Jung, Paul
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Treatment outcomes of advanced/metastatic extramammary Paget's disease in Korean patients: KCSG‐RC20‐06
Sohn, Byeong Seok, Kim, Jeongeun, Kim, Miso, Hong, Jung Yong, Lee, Jieun, Park, Song Ee, Kim, Hyojeong, Lee, Hyo Jin, Kang, Eun Joo, Lee, Soon Il, Lee, In Hee, Huh, Seok Jae, Jo, Jeongmin, Kim, Ho Young
Published in Cancer medicine (Malden, MA) (01.07.2023)
Published in Cancer medicine (Malden, MA) (01.07.2023)
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Journal Article
Investigating effects of multimodal explanations using multiple In-vehicle displays for takeover request in conditionally automated driving
Lee, Sangwon, Hong, Jeonguk, Jeon, Gyewon, Jo, Jeongmin, Boo, Sanghyeok, Kim, Hwiseong, Jung, Seoyoon, Park, Jieun, Choi, Inheon, Kim, Sangyeon
Published in Transportation research. Part F, Traffic psychology and behaviour (01.07.2023)
Published in Transportation research. Part F, Traffic psychology and behaviour (01.07.2023)
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Journal Article
System-level practical dynamic voltage drop simulation with IC internal VRM
Jeongmin Jo, Seil Kim, Seungbae Lee, Sangwoo Pae
Published in 2016 IEEE 20th Workshop on Signal and Power Integrity (SPI) (01.05.2016)
Published in 2016 IEEE 20th Workshop on Signal and Power Integrity (SPI) (01.05.2016)
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Conference Proceeding
Development of the linear synchronous motor propulsion testbed for super speed maglev
Jinho Lee, Jeongmin Jo, Youngjae Han, Changyoung Lee
Published in 2013 International Conference on Electrical Machines and Systems (ICEMS) (01.10.2013)
Published in 2013 International Conference on Electrical Machines and Systems (ICEMS) (01.10.2013)
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Conference Proceeding
Development of LSM control system for super speed maglev
Jinho Lee, Jeongmin Jo, Youngjae Han, Changyoung Lee
Published in 2013 13th International Conference on Control, Automation and Systems (ICCAS 2013) (01.10.2013)
Published in 2013 13th International Conference on Control, Automation and Systems (ICCAS 2013) (01.10.2013)
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Conference Proceeding
Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology
Uemura, Taiki, Chung, Byungjin, Jo, Jeongmin, Kim, Mijoung, Lee, Dalhee, Kim, Gunrae, Lee, Seungbae, Song, Taesjoong, Rhee, Hwasung, Lee, Brandon, Choi, Jaehee
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
Modeling and co-simulation of I/O interconnects for on-chip and off-chip EMI prediction
SangKeun Kwak, Jeongmin Jo, SoYoung Kim
Published in 2012 Asia-Pacific Symposium on Electromagnetic Compatibility (01.05.2012)
Published in 2012 Asia-Pacific Symposium on Electromagnetic Compatibility (01.05.2012)
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Conference Proceeding
Aging-Aware Design Verification Methods Under Real Product Operating Conditions
Shim, Hyewon, Jo, Jeongmin, Kim, Yoohwan, Jeong, Bongyong, Shon, Minji, Jiang, Hai, Pae, Sangwoo
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET
Uemura, Taiki, Chung, Byungjin, Jo, Jeongmin, Jiang, Hai, Ji, Yongsung, Jeong, Tae-Young, Ranjan, Rakesh, Park, Youngin, Hong, Kiil, Lee, Seungbae, Rhee, Hwasung, Pae, Sangwoo, Lee, Euncheol, Choi, Jaehee, Ohnishi, Shota, Machida, Ken
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
Bulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs
SangKeun Kwak, JeongMin Jo, SeokSoon Noh, HyeSook Lee, Wansoo Nah, SoYoung Kim
Published in 2012 Asia-Pacific Symposium on Electromagnetic Compatibility (01.05.2012)
Published in 2012 Asia-Pacific Symposium on Electromagnetic Compatibility (01.05.2012)
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Conference Proceeding
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM
Uemura, Taiki, Chung, Byungjin, Jo, Jeongmin, Jiang, Hai, Ji, Yongsung, Jeong, Tae-Young, Ranjan, Rakesh, Lee, Seungbae, Rhee, Hwasung, Pae, Sangwoo, Lee, Euncheol, Choi, Jaehee, Ohnishi, Shota, Machida, Ken
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding