Unified Subthreshold Coupling Factor Technique for Surface Potential and Subgap Density-of-States in Amorphous Thin Film Transistors
Jun, Sungwoo, Jo, Chunhyung, Bae, Hagyoul, Choi, Hyunjun, Kim, Dae Hwan, Kim, Dong Myong
Published in IEEE electron device letters (01.05.2013)
Published in IEEE electron device letters (01.05.2013)
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Journal Article
Single-Scan Monochromatic Photonic Capacitance-Voltage Technique for Extraction of Subgap DOS Over the Bandgap in Amorphous Semiconductor TFTs
Hagyoul Bae, Hyunjun Choi, Sungwoo Jun, Chunhyung Jo, Yun Hyeok Kim, Jun Seok Hwang, Jaeyeop Ahn, Oh, Saeroonter, Jong-Uk Bae, Sung-Jin Choi, Dae Hwan Kim, Dong Myong Kim
Published in IEEE electron device letters (01.12.2013)
Published in IEEE electron device letters (01.12.2013)
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Journal Article
The Effect of Gate and Drain Fields on the Competition Between Donor-Like State Creation and Local Electron Trapping in In-Ga-Zn-O Thin Film Transistors Under Current Stress
Sungju Choi, Hyeongjung Kim, Chunhyung Jo, Hyun-Suk Kim, Sung-Jin Choi, Dong Myong Kim, Park, Jozeph, Dae Hwan Kim
Published in IEEE electron device letters (01.12.2015)
Published in IEEE electron device letters (01.12.2015)
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Journal Article
A Study on the Degradation of In-Ga-Zn-O Thin-Film Transistors Under Current Stress by Local Variations in Density of States and Trapped Charge Distribution
Sungju Choi, Hyeongjung Kim, Chunhyung Jo, Hyun-Suk Kim, Sung-Jin Choi, Dong Myong Kim, Park, Jozeph, Dae Hwan Kim
Published in IEEE electron device letters (01.07.2015)
Published in IEEE electron device letters (01.07.2015)
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Journal Article
Characterization of Intrinsic Field-Effect Mobility in TFTs by De-Embedding the Effect of Parasitic Source and Drain Resistances
HUR, Inseok, BAE, Hagyoul, DONG MYONG KIM, KIM, Woojoon, KIM, Jaehyeong, HYUN KWANG JEONG, JO, Chunhyung, JUN, Sungwoo, LEE, Jaewook, YUN HYEOK KIM, DAE HWAN KIM
Published in IEEE electron device letters (01.02.2013)
Published in IEEE electron device letters (01.02.2013)
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Journal Article
The Effect of Gate and Drain Fields on the Competition Between Donor-Like State Creation and Local Electron Trapping in In-G-Zn-O Thin Film Transistors Under Current Stress
Choi, Sungju, Kim, Hyeongjung, Jo, Chunhyung, Kim, Hyun-Suk, Choi, Sung-Jin, Kim, Dong Myong, Park, Jozeph, Kim, Dae Hwan
Published in IEEE electron device letters (01.12.2015)
Published in IEEE electron device letters (01.12.2015)
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Journal Article
High performance gallium-zinc oxynitride thin film transistors for next-generation display applications
Kim, Tae Sang, Kim, Hyun-Suk, Park, Joon Seok, Son, Kyoung Seok, Kim, Eok Su, Seon, Jong-Baek, Lee, Sunhee, Seo, Seok-Jun, Kim, Sun-Jae, Jun, Sungwoo, Lee, Kyung Min, Shin, Dong Jae, Lee, Jaewook, Jo, Chunhyung, Choi, Sung-Jin, Kim, Dong Myong, Kim, Dae Hwan, Ryu, Myungkwan, Cho, Seong-Ho, Park, Youngsoo
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)
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