Search Results - "Jiruše Jaroslav" :: K.UTB vyhledávací portál

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Novel field emission SEM column with beam deceleration technology

by Jiruše, Jaroslav, Havelka, Miloslav, Lopour, Filip
Published in Ultramicroscopy (01.11.2014)

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Correlative microscopy and spectroscopy of nanophotonic materials

by Foltýn, Michael, Liška, Petr, Kepič, Peter, Motúz, Rastislav, Jiruše, Jaroslav, Konečná, Andrea, Křápek, Vlastimil, Šikola, Tomáš, Horák, Michal
Published in BIO web of conferences (2024)

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High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses : A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM

by Sedláček, Libor, Jiruše, Jaroslav, Friedli, Vinzenz, Bechelany, Mikhael, Michler, Johann, Whitby, James A., Hohl, Markus, Utke, Ivo, Riesterer, Jessica L., Östlund, Fredrik, Horvath, Peter, Gabureac, Mihai
Published in Advances in materials science and engineering (01.01.2012)

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Novel Cathodoluminescence Detector with Extremely Large Field of View

by Kolosová, Jolana, Jiruse, Jaroslav
Published in Microscopy and microanalysis (01.08.2014)

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On the Calculation of SEM and FIB Beam Profiles

by Kološová, Jolana, Hrnčíř, Tomáš, Jiruše, Jaroslav, Rudolf, Miroslav, Zlámal, Jakub
Published in Microscopy and microanalysis (01.06.2015)

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New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System

by Jiruše, Jaroslav, Havelka, Miloslav, Haničinec, Martin, Polster, Jan, Hrnčíř, Tomáš
Published in Microscopy and microanalysis (01.08.2014)

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Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS

by Sedláček, Libor, Kološová, Jolana, Jiruše, Jaroslav, Stevie, Fred A.
Published in Microscopy and microanalysis (01.08.2014)

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An Optimized In-column Detection System for the Ultra-high Resolution BrightBeamTM SEM Column

by Jiruše, Jaroslav, Sytař, Petr, Páral, Jan, Hrnčíř, Tomáš
Published in Microscopy and microanalysis (01.08.2020)

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An Optimized In-column Detection System for the Ultra-high Resolution BrightBeam TM SEM Column

by Jiruše, Jaroslav, Sytař, Petr, Páral, Jan, Hrnčíř, Tomáš
Published in Microscopy and microanalysis (01.08.2020)

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A New Generation Plasma FIB Column with Higher Probe Current and Improved Imaging Resolution

by Hrnčíř, Tomáš, Nešpor, Dušan, Radi, Zsolt, Jiruše, Jaroslav, Hladík, Lukáš, Salord, Olivier, Delobbe, Anne
Published in Microscopy and microanalysis (01.08.2020)

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A New SEM Column Combining Ultra-High Resolution and Flexible Scanning

by Sytaf, Petr, Jiruse, Jaroslav, Zavodny, Adam
Published in Microscopy and microanalysis (01.07.2017)

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A Detection System with Controlled Surface Sensitivity for a New UHR SEM

by Sytaf, Petr, Jiruse, Jaroslav, Paral, Jan
Published in Microscopy and microanalysis (01.07.2017)

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Design of an Ultra-High Resolution SEM for Enhanced Analysis

by Jiruse, Jaroslav, Havelka, Miloslav, Polster, Jan
Published in Microscopy and microanalysis (01.07.2016)

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A device with an ion tube and a scanning electron microscope

by Lopour, Filip, Jiruše, Jaroslav
Year of Publication 20.12.2023

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Patent

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S9000X - Next Generation of Ultra-High Resolution SEM for Enhanced Analysis and Xe Plasma FIB for Ultra-Fast and Gentle Sputtering

by Havelka, Miloslav, Jiruse, Jaroslav, Hrncif, Tomas, Jan Polster, Vana, Rostislav, Zachej, Samuel
Published in Microscopy and microanalysis (01.08.2018)

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Detection Systems of Ultra-High-Resolution SEMs

by Jiruse, Jaroslav, Havelka, Miloslav, Polster, Jan, Sytaf, Petr, Paral, Jan, Kolosova, Jolana
Published in Microscopy and microanalysis (01.08.2018)

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FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy

by Jiruse, Jaroslav, Hanicinec, Martin, Havelka, Miloslav, Hollricher, Olaf, Ibach, Wolfram, Spizig, Peter
Published in Microscopy and microanalysis (01.08.2014)

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Journal Article