Search Results - "Jiruše, Jaroslav" :: K.UTB vyhledávací portál

Loading…

Novel field emission SEM column with beam deceleration technology

by Jiruše, Jaroslav, Havelka, Miloslav, Lopour, Filip
Published in Ultramicroscopy (01.11.2014)

Get full text

Journal Article

Loading…

Correlative microscopy and spectroscopy of nanophotonic materials

by Foltýn, Michael, Liška, Petr, Kepič, Peter, Motúz, Rastislav, Jiruše, Jaroslav, Konečná, Andrea, Křápek, Vlastimil, Šikola, Tomáš, Horák, Michal
Published in BIO web of conferences (2024)

Get full text

Journal Article

Loading…

High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses : A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM

by Sedláček, Libor, Jiruše, Jaroslav, Friedli, Vinzenz, Bechelany, Mikhael, Michler, Johann, Whitby, James A., Hohl, Markus, Utke, Ivo, Riesterer, Jessica L., Östlund, Fredrik, Horvath, Peter, Gabureac, Mihai
Published in Advances in materials science and engineering (01.01.2012)

Get full text

Journal Article

Loading…

Novel Cathodoluminescence Detector with Extremely Large Field of View

by Kolosová, Jolana, Jiruse, Jaroslav
Published in Microscopy and microanalysis (01.08.2014)

Get full text

Journal Article

Loading…

On the Calculation of SEM and FIB Beam Profiles

by Kološová, Jolana, Hrnčíř, Tomáš, Jiruše, Jaroslav, Rudolf, Miroslav, Zlámal, Jakub
Published in Microscopy and microanalysis (01.06.2015)

Get full text

Journal Article

Loading…

New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System

by Jiruše, Jaroslav, Havelka, Miloslav, Haničinec, Martin, Polster, Jan, Hrnčíř, Tomáš
Published in Microscopy and microanalysis (01.08.2014)

Get full text

Journal Article

Loading…

Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS

by Sedláček, Libor, Kološová, Jolana, Jiruše, Jaroslav, Stevie, Fred A.
Published in Microscopy and microanalysis (01.08.2014)

Get full text

Journal Article

Loading…

An Optimized In-column Detection System for the Ultra-high Resolution BrightBeamTM SEM Column

by Jiruše, Jaroslav, Sytař, Petr, Páral, Jan, Hrnčíř, Tomáš
Published in Microscopy and microanalysis (01.08.2020)

Get full text

Journal Article

Loading…

An Optimized In-column Detection System for the Ultra-high Resolution BrightBeam TM SEM Column

by Jiruše, Jaroslav, Sytař, Petr, Páral, Jan, Hrnčíř, Tomáš
Published in Microscopy and microanalysis (01.08.2020)

Get full text

Journal Article

Loading…

A New Generation Plasma FIB Column with Higher Probe Current and Improved Imaging Resolution

by Hrnčíř, Tomáš, Nešpor, Dušan, Radi, Zsolt, Jiruše, Jaroslav, Hladík, Lukáš, Salord, Olivier, Delobbe, Anne
Published in Microscopy and microanalysis (01.08.2020)

Get full text

Journal Article

Loading…

A New SEM Column Combining Ultra-High Resolution and Flexible Scanning

by Sytaf, Petr, Jiruse, Jaroslav, Zavodny, Adam
Published in Microscopy and microanalysis (01.07.2017)

Get full text

Journal Article

Loading…

A Detection System with Controlled Surface Sensitivity for a New UHR SEM

by Sytaf, Petr, Jiruse, Jaroslav, Paral, Jan
Published in Microscopy and microanalysis (01.07.2017)

Get full text

Journal Article

Loading…

Design of an Ultra-High Resolution SEM for Enhanced Analysis

by Jiruse, Jaroslav, Havelka, Miloslav, Polster, Jan
Published in Microscopy and microanalysis (01.07.2016)

Get full text

Journal Article

Loading…

A device with an ion tube and a scanning electron microscope

by Lopour, Filip, Jiruše, Jaroslav
Year of Publication 20.12.2023

Get full text

Patent

Loading…

S9000X - Next Generation of Ultra-High Resolution SEM for Enhanced Analysis and Xe Plasma FIB for Ultra-Fast and Gentle Sputtering

by Havelka, Miloslav, Jiruse, Jaroslav, Hrncif, Tomas, Jan Polster, Vana, Rostislav, Zachej, Samuel
Published in Microscopy and microanalysis (01.08.2018)

Get full text

Journal Article

Loading…

Detection Systems of Ultra-High-Resolution SEMs

by Jiruse, Jaroslav, Havelka, Miloslav, Polster, Jan, Sytaf, Petr, Paral, Jan, Kolosova, Jolana
Published in Microscopy and microanalysis (01.08.2018)

Get full text

Journal Article

Loading…

FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy

by Jiruse, Jaroslav, Hanicinec, Martin, Havelka, Miloslav, Hollricher, Olaf, Ibach, Wolfram, Spizig, Peter
Published in Microscopy and microanalysis (01.08.2014)

Get full text

Journal Article