In-Depth Sample Analysis with a Signal-Selective SEM Detection System
Havelka, M., Jiruše, J., Mareš, P., Kolosova, J.
Published in Microscopy and microanalysis (01.07.2016)
Published in Microscopy and microanalysis (01.07.2016)
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Journal Article
Low Energy BSE Imaging with a New Scintillation Detector
Kolosova, J., Jiruse, J., Fiala, J., Beranek, J.
Published in Microscopy and microanalysis (01.08.2015)
Published in Microscopy and microanalysis (01.08.2015)
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Journal Article
Xe Plasma FIB-SEM with Improved Resolution of Both Ion and Electron Columns
Jiruse, J., Havelka, M., Polster, J., Hrncif, T.
Published in Microscopy and microanalysis (01.08.2015)
Published in Microscopy and microanalysis (01.08.2015)
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Journal Article
FIB-SIMS quantification using TOF-SIMS with Ar and Xe plasma sources
Stevie, F. A., Sedlacek, L., Babor, P., Jiruse, J., Principe, E., Klosova, K.
Published in Surface and interface analysis (01.11.2014)
Published in Surface and interface analysis (01.11.2014)
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Journal Article
New Ultra-High Resolution SEM for Imaging by Low Energy Electrons
Jiruse, J., Havelka, M., Polster, J., Lopour, F.
Published in Microscopy and microanalysis (01.08.2013)
Published in Microscopy and microanalysis (01.08.2013)
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Journal Article
Fast 3D Tomography of C4 Solder Bump by Using Xe Plasma Focused Ion Beam
Hrncir, T., Hladik, L., Jiruse, J., Lopour, F.
Published in Microscopy and microanalysis (01.08.2013)
Published in Microscopy and microanalysis (01.08.2013)
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Journal Article
In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films
Spousta, J., Urbánek, M., Chmelík, R., Jiruše, J., Zlámal, J., Navrátil, K., Nebojsa, A., Šikola, T.
Published in Surface and interface analysis (01.08.2002)
Published in Surface and interface analysis (01.08.2002)
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Journal Article
Conference Proceeding
Combined plasma FIB-SEM
Jiruse, J., Hrncir, T., Lopour, F., Zadrazil, M., Delobe, A., Salord, O.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
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Journal Article
Combined SEM-FIB-SPM-TOF-EDX-EBSD as a Multifunctional Tool
Jiruse, J., Sedlacek, L., Rudolf, M., Friedli, V., Oestlund, F., Whitby, J.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
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Journal Article
Structure and formation of surface alloys by adsorption of Li on Al(1 1 0)
Mikkelsen, A., Petersen, J.H., Hoffmann, S.V., Jiruse, J., Adams, D.L.
Published in Surface science (20.07.2001)
Published in Surface science (20.07.2001)
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Journal Article
The surface structures formed by Na adsorption on Al( [formula omitted])
Mikkelsen, A., Petersen, J.H., Jiruse, J., Hoffmann, S.V., Adams, D.L.
Published in Surface science (20.01.2002)
Published in Surface science (20.01.2002)
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Journal Article
The step towards an ultimate multifunctional tool for nanotechnology
Zadrazil, M., Jiruse, J., Lencova, B., Dluhos, J., Hrncir, T., Rudolf, M., Sedlacek, L., Samoril, T.
Published in 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) (01.08.2012)
Published in 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) (01.08.2012)
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Conference Proceeding