Analog/RF Performance of Si Nanowire MOSFETs and the Impact of Process Variation
Runsheng Wang, Runsheng Wang, Jing Zhuge, Jing Zhuge, Ru Huang, Ru Huang, Yu Tian, Yu Tian, Han Xiao, Han Xiao, Liangliang Zhang, Liangliang Zhang, Chen Li, Chen Li, Xing Zhang, Xing Zhang, Yangyuan Wang, Yangyuan Wang
Published in IEEE transactions on electron devices (01.06.2007)
Published in IEEE transactions on electron devices (01.06.2007)
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Journal Article
Experimental Investigations on Carrier Transport in Si Nanowire Transistors: Ballistic Efficiency and Apparent Mobility
Wang, Runsheng, Liu, Hongwei, Huang, Ru, Zhuge, Jing, Zhang, Liangliang, Kim, Dong-Won, Zhang, Xing, Park, Donggun, Wang, Yangyuan
Published in IEEE transactions on electron devices (01.11.2008)
Published in IEEE transactions on electron devices (01.11.2008)
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Journal Article
Stable supercapacitor electrode based on two-dimensional high nucleus silver nano-clusters as a green energy source
Zhuge, Jing, Rouhani, Farzaneh, Bigdeli, Fahime, Gao, Xue-Mei, Kaviani, Hamed, Li, Hong-Jing, Wang, Wei, Hu, Mao-Lin, Liu, Kuan-Guan, Morsali, Ali
Published in Dalton transactions : an international journal of inorganic chemistry (21.02.2021)
Published in Dalton transactions : an international journal of inorganic chemistry (21.02.2021)
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Journal Article
High-Performance BOI FinFETs Based on Bulk-Silicon Substrate
Xu, Xiaoyan, Wang, Runsheng, Huang, Ru, Zhuge, Jing, Chen, Gang, Zhang, Xing, Wang, Yangyuan
Published in IEEE transactions on electron devices (01.11.2008)
Published in IEEE transactions on electron devices (01.11.2008)
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Journal Article
Investigation on Variability in Metal-Gate Si Nanowire MOSFETs: Analysis of Variation Sources and Experimental Characterization
Wang, Runsheng, Zhuge, Jing, Huang, Ru, Yu, Tao, Zou, Jibin, Kim, Dong-Won, Park, Donggun, Wang, Yangyuan
Published in IEEE transactions on electron devices (01.08.2011)
Published in IEEE transactions on electron devices (01.08.2011)
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Journal Article
Investigation of Low-Frequency Noise in Silicon Nanowire MOSFETs
Zhuge, Jing, Wang, Runsheng, Huang, Ru, Tian, Yu, Zhang, Liangliang, Kim, Dong-Won, Park, Donggun, Wang, Yangyuan
Published in IEEE electron device letters (01.01.2009)
Published in IEEE electron device letters (01.01.2009)
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Journal Article
Investigation of Nanowire Line-Edge Roughness in Gate-All-Around Silicon Nanowire MOSFETs
Yu, Tao, Wang, Runsheng, Huang, Ru, Chen, Jiang, Zhuge, Jing, Wang, Yangyuan
Published in IEEE transactions on electron devices (01.11.2010)
Published in IEEE transactions on electron devices (01.11.2010)
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Journal Article
Investigation of Thermal Noise in UTB GOI and SOI Devices
Pei, Yunpeng, Huang, Ru, An, Xia, Zhuge, Jing, Li, Xiaodong, Xiao, Han, Wang, Yangyuan
Published in IEEE transactions on electron devices (01.05.2008)
Published in IEEE transactions on electron devices (01.05.2008)
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Journal Article
Design Optimization for Digital Circuits Built With Gate-All-Around Silicon Nanowire Transistors
Yuchao Liu, Ru Huang, Runsheng Wang, Jing Zhuge, Qiumin Xu, Yangyuan Wang
Published in IEEE transactions on electron devices (01.07.2012)
Published in IEEE transactions on electron devices (01.07.2012)
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Journal Article
Experimental Demonstration of Current Mirrors Based on Silicon Nanowire Transistors for Inversion and Subthreshold Operations
Huang, Ru, Zou, Jibin, Wang, Runsheng, Fan, Chunhui, Ai, Yujie, Zhuge, Jing, Wang, Yangyuan
Published in IEEE transactions on electron devices (01.10.2011)
Published in IEEE transactions on electron devices (01.10.2011)
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Journal Article
HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors
Huang, Ru, Wang, Runsheng, Liu, Changze, Zhang, Liangliang, Zhuge, Jing, Tao, Yu, Zou, Jibin, Liu, Yuchao, Wang, Yangyuan
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Journal Article
Conference Proceeding
High-Performance Si Nanowire Transistors on Fully Si Bulk Substrate From Top-Down Approach: Simulation and Fabrication
Zhuge, Jing, Tian, Yu, Wang, Runsheng, Huang, Ru, Wang, Yiqun, Chen, Baoqin, Liu, Jia, Zhang, Xing, Wang, Yangyuan
Published in IEEE transactions on nanotechnology (01.01.2010)
Published in IEEE transactions on nanotechnology (01.01.2010)
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Journal Article
Characterization and analysis of gate-all-around Si nanowire transistors for extreme scaling
Ru Huang, Runsheng Wang, Jing Zhuge, Changze Liu, Tao Yu, Liangliang Zhang, Xin Huang, Yujie Ai, Jinbin Zou, Yuchao Liu, Jiewen Fan, Huailin Liao, Yangyuan Wang
Published in 2011 IEEE Custom Integrated Circuits Conference (CICC) (01.09.2011)
Published in 2011 IEEE Custom Integrated Circuits Conference (CICC) (01.09.2011)
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Conference Proceeding
Characteristics of Gate Current Random Telegraph Signal Noise in SiON/HfO2/TaN p-Type Metal--Oxide--Semiconductor Field-Effect Transistors under Negative Bias Temperature Instability Stress Condition
Zhang, Liangliang, Liu, Changze, Wang, Runsheng, Huang, Ru, Yu, Tao, Zhuge, Jing, Kirsch, Paul, Tseng, Hsing-Huang, Wang, Yangyuan
Published in Jpn J Appl Phys (01.04.2010)
Published in Jpn J Appl Phys (01.04.2010)
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Journal Article
A comparative study on analog/RF performance of UTB GOI and SOI devices
Zhuge, Jing, An, Xia, Huang, Ru, Xiao, Han, Hou, Xiaoyu, Wang, Runsheng, Wang, Yangyuan
Published in Semiconductor science and technology (01.07.2008)
Published in Semiconductor science and technology (01.07.2008)
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Journal Article