Structure for an absolute duty cycle measurement circuit
Boerstler, David W, Hailu, Eskinder, Kaneko, Masaaki, Qi, Jieming, Wan, Bin
Year of Publication 04.10.2011
Get full text
Year of Publication 04.10.2011
Patent
Structure for a duty cycle measurement circuit
Boerstler, David W, Hailu, Eskinder, Kaneko, Masaaki, Qi, Jieming, Wan, Bin
Year of Publication 29.03.2011
Get full text
Year of Publication 29.03.2011
Patent
Digital circuit to measure and/or correct duty cycles
Boerstler, David William, Hailu, Eskinder, Krauter, Byron Lee, Miki, Kazuhiko, Qi, Jieming
Year of Publication 29.03.2011
Get full text
Year of Publication 29.03.2011
Patent
Absolute duty cycle measurement
Boerstler, David W, Hailu, Eskinder, Kaneko, Masaaki, Qi, Jieming, Wan, Bin
Year of Publication 08.03.2011
Get full text
Year of Publication 08.03.2011
Patent
Duty cycle measurement for various signals throughout an integrated circuit device
Boerstler, David W, Hailu, Eskinder, Kaneko, Masaaki, Qi, Jieming, Wan, Bin
Year of Publication 22.02.2011
Get full text
Year of Publication 22.02.2011
Patent
Structure for a phase locked loop with adjustable voltage based on temperature
Boerstler, David W, Chadwick, Nathaniel R, Hailu, Eskinder, Peterson, Kirk D, Qi, Jieming
Year of Publication 25.01.2011
Get full text
Year of Publication 25.01.2011
Patent
A new test and characterization scheme for 10+ GHz low jitter wide band PLL
Miki, Kazuhiko, Boerstler, David, Hailu, Eskinder, Qi, Jieming, Pettengill, Sarah, Goto, Yuichi
Published in Proceedings of the 2006 Asia and South Pacific Design Automation Conference (24.01.2006)
Published in Proceedings of the 2006 Asia and South Pacific Design Automation Conference (24.01.2006)
Get full text
Conference Proceeding
Adjusting voltage for a phase locked loop based on temperature
Boerstler, David W, Chadwick, Nathaniel R, Hailu, Eskinder, Peterson, Kirk D, Qi, Jieming
Year of Publication 17.02.2009
Get full text
Year of Publication 17.02.2009
Patent
Digital circuit to measure and/or correct duty cycles
Boerstler, David William, Hailu, Eskinder, Krauter, Byron Lee, Miki, Kazuhiko, Qi, Jieming
Year of Publication 25.03.2008
Get full text
Year of Publication 25.03.2008
Patent
A new test and characterization scheme for 10+ GHz low jitter wide band PLL
Miki, K., Boerstler, D., Hailu, E., Qi, J., Pettengill, S., Yuichi Goto
Published in Asia and South Pacific Conference on Design Automation, 2006 (2006)
Published in Asia and South Pacific Conference on Design Automation, 2006 (2006)
Get full text
Conference Proceeding