Methods for imperfect insulating film electrical thickness/capacitance measurement
Zhang, Xiafang (Michelle), Xu, Zhiwei (Steve), Shi, Jianou, Vu, Quoc-Bao, Miller, Thomas G, Horner, Gregory S
Year of Publication 08.07.2008
Get full text
Year of Publication 08.07.2008
Patent
Systems and methods for using non-contact voltage sensors and corona discharge guns
PEI SHIYOU, MIRZAAGHAEIAN MAHMOOD, XU ZHIWEI (STEVE), RZEPIELA JEFFREY A, SHI JIANOU
Year of Publication 19.09.2006
Get full text
Year of Publication 19.09.2006
Patent
Systems and methods for using non-contact voltage sensors and corona discharge guns
Xu, Zhiwei (Steve), Shi, Jianou, Pei, Shiyou, Mirzaaghaeian, Mahmood, Rzepiela, Jeffrey A
Year of Publication 19.09.2006
Get full text
Year of Publication 19.09.2006
Patent
Corona based charge voltage measurement
Edelstein, Sergio, Bouche, Eric F, Shi, Jianou, Pei, Shiyou, Zhang, Xiafang
Year of Publication 29.08.2006
Get full text
Year of Publication 29.08.2006
Patent
Corona based charge voltage measurement
PEI SHIYOU, ZHANG XIAFANG, EDELSTEIN SERGIO, SHI JIANOU, BOUCHE ERIC F
Year of Publication 29.08.2006
Get full text
Year of Publication 29.08.2006
Patent
Methods for imperfect insulating film electrical thickness/capacitance measurement
Zhang, Xiafang (Michelle), Xu, Zhiwei (Steve), Shi, Jianou, Vu, Bao, Miller, Thomas G, Horner, Gregory S
Year of Publication 11.07.2006
Get full text
Year of Publication 11.07.2006
Patent
TEST PADS FOR MEASURING PROPERTIES OF A WAFER
KAGAN, ALEXANDER, FENG, YIPING, PEI, SHIYOU, YEH, DENNIS, EDELSTEIN, SERGIO, ZHANG, XIAFANG, SHI, JIANOU, HUANG, SHU, CHUN, KHAN, AHMAD, RZEPIELA, JEFFREY, A
Year of Publication 23.04.2009
Get full text
Year of Publication 23.04.2009
Patent