by Kai-Shin Li, Pin-Guang Chen, Tung-Yan Lai, Chang-Hsien Lin, Cheng-Chih Cheng, Chun-Chi Chen, Yun-Jie Wei, Yun-Fang Hou, Ming-Han Liao, Min-Hung Lee, Min-Cheng Chen, Jia-Min Sheih, Wen-Kuan Yeh, Fu-Liang Yang, Salahuddin, Sayeef, Chenming Hu
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)