A noncontact NDE method using a laser generated focused-Lamb wave with enhanced defect-detection ability and spatial resolution
Kim, Hongjoon, Jhang, Kyungyoung, Shin, Minjea, Kim, Jaeyeol
Published in NDT & E international : independent nondestructive testing and evaluation (01.06.2006)
Published in NDT & E international : independent nondestructive testing and evaluation (01.06.2006)
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Journal Article
Reliability evaluation of semiconductor using ultrasound
Hyoseong Jang, Job Ha, Kyungyoung Jhang, Joonhyun Lee
Published in Advances in Electronic Materials and Packaging 2001 (Cat. No.01EX506) (2001)
Published in Advances in Electronic Materials and Packaging 2001 (Cat. No.01EX506) (2001)
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Conference Proceeding
Wavelet analysis based deconvolution to improve the resolution of scanning acoustic microscope images for the inspection of thin die layer in semiconductor
Jhang, Kyungyoung, Jang, Hyoseong, Park, Byungil, Ha, Job, Park, Ikkeun, Kim, Kyungsuk
Published in NDT & E international : independent nondestructive testing and evaluation (01.12.2002)
Published in NDT & E international : independent nondestructive testing and evaluation (01.12.2002)
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Journal Article