by Bouyssou, E., Jérisian, R., Cézac, N., Leduc, P., Guégan, G., Anceau, C.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (25.04.2005)

by Bouyssou, E, Leduc, P, Guégan, G, Jérisian, R
Published in Journal of physics. Conference series (01.01.2005)

by Belgacem, B, Alquier, D, Muralt, P, Baborowski, J, Lucas, S, Jerisian, R
Published in Journal of micromechanics and microengineering (01.02.2004)

by Cayrel, F., Alquier, D., Dubois, C., Jérisian, R.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05.12.2005)

by MOREAU, S, LEQUEU, T, JERISIAN, R
Published in Microelectronics and reliability (01.09.2004)

by Gautier, G, Ventura, L, Jérisian, R
Published in Journal of physics. Conference series (01.01.2005)

by Gautier, G., Ventura, L., Pordié, T., Rogel, R., Jérisian, R.
Published in Thin solid films (01.09.2005)

by Cayrel, F., Alquier, D., Mathiot, D., Ventura, L., Vincent, L., Gaudin, G., Jérisian, R.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.02.2004)

by Gaudin, G., Cayrel, F., Bongiorno, C., Jérisian, R., Dubois, C., Raineri, V., Alquier, D.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05.12.2005)

by Roqueta, F., Alquier, D., Ventura, L., Dubois, Ch, Jérisian, R.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.10.2001)

by Forster, S., Lequeu, T., Jérisian, R.
Published in Microelectronics and reliability (01.01.2003)

by Ortiz, Ch, Mathiot, D, Alquier, D, Dubois, Ch, Jérisian, R
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.05.2001)

by Roqueta, F, Ventura, L, Grob, J.J, Jérisian, R
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.05.2001)

by Roqueta, F., Grob, A., Grob, J.J., Jérisian, R., Stoquert, J.P., Ventura, L.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (1999)

by Moreau, S., Forster, S., Lequeu, T., Jérisian, R.
Published in Microelectronics and reliability (01.09.2002)

by Forster, S., Lequeu, T., Jérisian, R.
Published in Microelectronics and reliability (01.09.2001)

by Bouyssou, E., Bruyere, S., Guegan, G., Anceau, C., Jerisian, R.
Published in 2005 IEEE International Integrated Reliability Workshop (2005)

by Oussalah, S., Jerisian, R.
Published in Microelectronics and reliability (01.10.1997)

by Ortiz, Ch, Grob, J.J., Mathiot, D., Claverie, A., Dubois, Ch, Jérisian, R.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (1999)

by Seghir, K., Cristoloveanu, S., Jerisian, R., Oualid, J., Auberton-Herve, A.-J.
Published in IEEE transactions on electron devices (01.06.1993)