Enhanced High-Frequency Performance of Top-Gated Graphene FETs Due to Substrate- Induced Improvements in Charge Carrier Saturation Velocity
Asad, Muhammad, Jeppson, Kjell O., Vorobiev, Andrei, Bonmann, Marlene, Stake, Jan
Published in IEEE transactions on electron devices (01.02.2021)
Published in IEEE transactions on electron devices (01.02.2021)
Get full text
Journal Article
Applications of aluminium nitride films deposited by reactive sputtering to silicon-on-insulator materials
BENGTSSON, S, BERGH, M, CHOUMAS, M, OLESEN, C, JEPPSON, K. O
Published in Japanese Journal of Applied Physics (01.08.1996)
Published in Japanese Journal of Applied Physics (01.08.1996)
Get full text
Journal Article
Compact Spreading Resistance Model for Rectangular Contacts on Uniform and Epitaxial Substrates
Kristiansson, S., Ingvarson, F., Jeppson, K.O.
Published in IEEE transactions on electron devices (01.09.2007)
Published in IEEE transactions on electron devices (01.09.2007)
Get full text
Journal Article
A surface potential model for predicting substrate noise coupling in integrated circuits
Kristiansson, S., Ingvarson, F., Kagganti, S.P., Simic, N., Zgrda, M., Jeppson, K.O.
Published in IEEE journal of solid-state circuits (01.09.2005)
Published in IEEE journal of solid-state circuits (01.09.2005)
Get full text
Journal Article
Conference Proceeding
Resistance Modelling in 1D, 2D, and 3D for Substrate Networks
Kagganti, Shiva P, Kristiansson, Simon, Ingvarson, Fredrik, Jeppson, Kjell O
Published in Physica scripta (01.01.2004)
Published in Physica scripta (01.01.2004)
Get full text
Journal Article
Static characterization and parameter extraction in MOS transistors
Get full text
Journal Article
Conference Proceeding
Extraction of the base and emitter resistances in bipolar transistors using an accurate base resistance model
Ingvarson, F., Linder, M., Jeppson, K.O.
Published in IEEE transactions on semiconductor manufacturing (01.05.2003)
Published in IEEE transactions on semiconductor manufacturing (01.05.2003)
Get full text
Journal Article
Conference Proceeding
Three- and four-point Hamer-type MOSFET parameter extraction methods revisited
Jeppson, K. O.
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Get full text
Conference Proceeding
An analytical strategy for fast extraction of MOS transistor DC parameters applied to the SPICE MOS3 and BSIM models
Karlsson, Peter R, Jeppson, Kjell O
Published in IEEE International Conference on Microelectronic Test Structures, 1992 (01.01.1992)
Get full text
Published in IEEE International Conference on Microelectronic Test Structures, 1992 (01.01.1992)
Journal Article
Conference Proceeding
CMOS Circuit Speed and Buffer Optimization
Hedenstierna, N., Jeppson, K.O.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.1987)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.1987)
Get full text
Journal Article