Ground guard structure to reduce the crosstalk noise and electromagnetic interference (EMI) in a vertical probe card for wafer-level testing
Eunjung Lee, Manho Lee, Kim, Jonghoon J., Mijoo Kim, Jonghoon Kim, Joungho Kim, Jeoungkun Park, Younghoon Joo, Yoonhee Bang, Il Kim, Seungki Nam
Published in 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) (01.08.2014)
Published in 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) (01.08.2014)
Get full text
Conference Proceeding