Single Metal BCAT Breakthrough to Open a New Era of 12 nm DRAM and Beyond
Chae, Kyosuk, Rim, Taiuk, Son, Youngwoo, Choi, Heejae, Lee, Jinseong, Jeong, Shinwoo, Lee, Jieun, Lee, Dongin, Lee, Byunghyun, Woo, Dongsoo, Park, Seguen, Hwang, Sangjun
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
Investigation of Sub-20nm 4th generation DRAM cell transistor's parasitic resistance and scalable methodology for Sub-20nm era
Jeong, Shinwoo, Lee, Jin-Seong, Jang, Jiuk, Kim, Jooncheol, Shin, Hyunsu, Kim, Ji Hun, Song, Jeongwoo, Woo, Dongsoo, Oh, Jeonghoon, Lee, Jooyoung
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
14nm DRAM Development and Manufacturing
Kim, Kanguk, Son, Youngwoo, Ryu, Hoin, Lee, Byunghyun, Kim, Jooncheol, Shin, Hyunsu, Kang, Joonyoung, Kim, Jihun, Jeong, Shinwoo, Chae, Kyosuk, Lee, Dongkak, Jung, Ilwoo, Kim, Yongkwan, Song, Boyoung, Oh, Jeonghoon, Song, Jungwoo, Park, Seguen, Lee, Keumjoo, Ban, Hyodong, Kim, Jiyoung, Lee, Jooyoung
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
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Conference Proceeding