Water-Mediated Photochemical Treatments for Low-Temperature Passivation of Metal-Oxide Thin-Film Transistors
Heo, Jae Sang, Jo, Jeong-Wan, Kang, Jingu, Jeong, Chan-Yong, Jeong, Hu Young, Kim, Sung Kyu, Kim, Kwanpyo, Kwon, Hyuck-In, Kim, Jaekyun, Kim, Yong-Hoon, Kim, Myung-Gil, Park, Sung Kyu
Published in ACS applied materials & interfaces (27.04.2016)
Published in ACS applied materials & interfaces (27.04.2016)
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Journal Article
Investigation of Carrier Transport Mechanism in High Mobility ZnON Thin-Film Transistors
Jeong, Chan-Yong, Kim, Hee-Joong, Kim, Dae-Hwan, Kim, Hyun-Suk, Kim, Tae Sang, Seon, Jong-Baek, Lee, Sunhee, Kim, Dae Hwan, Kwon, Hyuck-In
Published in IEEE electron device letters (01.12.2016)
Published in IEEE electron device letters (01.12.2016)
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Journal Article
Electrical Instability of p-Channel SnO Thin-Film Transistors Under Light Illumination
Lee, Jeong-Hwan, Choi, Yong-Jin, Jeong, Chan-Yong, Jung, Dong-Kyu, Ham, Soohoon, Kwon, Hyuck-In
Published in IEEE electron device letters (01.03.2016)
Published in IEEE electron device letters (01.03.2016)
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Journal Article
Environment-Dependent Bias Stress Stability of P-Type SnO Thin-Film Transistors
Han, Young-Joon, Choi, Yong-Jin, Jeong, Chan-Yong, Lee, Daeun, Song, Sang-Hun, Kwon, Hyuck-In
Published in IEEE electron device letters (01.05.2015)
Published in IEEE electron device letters (01.05.2015)
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Journal Article
Charge Transport Mechanism in p-Channel Tin Monoxide Thin-Film Transistors
Kim, Hee-Joong, Jeong, Chan-Yong, Bae, Sang-Dae, Lee, Jeong-Hwan, Kwon, Hyuck-In
Published in IEEE electron device letters (01.04.2017)
Published in IEEE electron device letters (01.04.2017)
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Journal Article
Effect of Temperature and Electric Field on Degradation in Amorphous InGaZnO TFTs Under Positive Gate and Drain Bias Stress
JONG IN KIM, CHO, In-Tak, JOE, Sung-Min, JEONG, Chan-Yong, DAEUN LEE, KWON, Hyuck-In, SUNG HUN JIN, LEE, Jong-Ho
Published in IEEE electron device letters (01.04.2014)
Published in IEEE electron device letters (01.04.2014)
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Journal Article
A study on the degradation mechanism of InGaZnO thin-film transistors under simultaneous gate and drain bias stresses based on the electronic trap characterization
Jeong, Chan-Yong, Lee, Daeun, Song, Sang-Hun, Kim, Jong In, Lee, Jong-Ho, Kwon, Hyuck-In
Published in Semiconductor science and technology (01.04.2014)
Published in Semiconductor science and technology (01.04.2014)
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Journal Article
Local-Degradation-Induced Threshold Voltage Shift in Turned-OFF Amorphous InGaZnO Thin Film Transistors Under AC Drain Bias Stress
Kim, Jong In, Cho, In-Tak, Jeong, Chan-Yong, Lee, Daeun, Kwon, Hyuck-In, Jung, Keum Dong, Park, Mun Soo, Seo, Mi Seon, Kim, Tae Young, Lee, Je Hun, Lee, Jong-Ho
Published in IEEE electron device letters (01.06.2015)
Published in IEEE electron device letters (01.06.2015)
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Journal Article
Investigation of Low-Frequency Noise Properties in High-Mobility ZnON Thin-Film Transistors
Jeong, Chan-Yong, Kim, Hee-Joong, Kim, Dae-Hwan, Kim, Hyun-Suk, Kim, Eok, Kim, Tae, Park, Joon, Seon, Jong-Baek, Son, Kyoung, Lee, Sunhee, Cho, Seong-Ho, Park, Young, Kim, Dae, Kwon, Hyuck-In
Published in IEEE electron device letters (01.06.2016)
Published in IEEE electron device letters (01.06.2016)
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Journal Article
Intra-octahedral proton transfer in bulk orthorhombic perovskite barium cerate
Jeong, Yong-Chan, Kim, Dae-Hee, Kim, Byung-Kook, Kim, Yeong-Cheol
Published in Solid state ionics (15.10.2012)
Published in Solid state ionics (15.10.2012)
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Journal Article
Fabrication of amorphous InGaZnO thin-film transistor-driven flexible thermal and pressure sensors
Park, Ick-Joon, Jeong, Chan-Yong, Cho, In-Tak, Lee, Jong-Ho, Cho, Eou-Sik, Kwon, Sang Jik, Kim, Bosul, Cheong, Woo-Seok, Song, Sang-Hun, Kwon, Hyuck-In
Published in Semiconductor science and technology (01.10.2012)
Published in Semiconductor science and technology (01.10.2012)
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Journal Article
Experimental Investigation of Physical Mechanism for Asymmetrical Degradation in Amorphous InGaZnO Thin-film Transistors under Simultaneous Gate and Drain Bias Stresses
Chan-Yong Jeong, Hee-Joong Kim, Jeong-Hwan Lee, Hyuck-In Kwon
Published in Journal of semiconductor technology and science (01.04.2017)
Published in Journal of semiconductor technology and science (01.04.2017)
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Journal Article