Microstructural Characterization in Reliability Measurement of Phase Change Random Access Memory
Bae, Junsoo, Hwang, Kyuman, Park, Kwangho, Jeon, Seongbu, Kang, Dae-hwan, Park, Soonoh, Ahn, Juhyeon, Kim, Seoksik, Jeong, Gitae, Chung, Chilhee
Published in Japanese Journal of Applied Physics (01.04.2011)
Published in Japanese Journal of Applied Physics (01.04.2011)
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Journal Article
Microstructural Characterization in Reliability Measurement of Phase Change Random Access Memory
Bae, Junsoo, Hwang, Kyuman, Park, Kwangho, Jeon, Seongbu, Kang, Dae-hwan, Park, Soonoh, Ahn, Juhyeon, Kim, Seoksik, Jeong, Gitae, Chung, Chilhee
Published in Japanese Journal of Applied Physics (01.04.2011)
Published in Japanese Journal of Applied Physics (01.04.2011)
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Journal Article
Comparative Analysis of TEM and Atom Probe Tomography on GeSbTe Compositions in Phase Change Random Access Memory
Hwang, K., Bae, J., Park, K., Jeon, S., Ahn, J., Kim, S., Jeong, H., Nam, S., Jeong, G., Jang, D., Park, C.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
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Journal Article