by Ahmed, Foisal, Jenihhin, Maksim
Published in Sensors (Basel, Switzerland) (21.08.2022)

by Rafiq, Ahsan, Jenihhin, Maksim
Published in e-Prime (01.09.2024)

by Rahbari, Dadmehr, Alam, Muhammad Mahtab, Le Moullec, Yannick, Jenihhin, Maksim
Published in IEEE access (2023)

by Oyeniran, Adeboye Stephen, Ubar, Raimund, Jenihhin, Maksim, Raik, Jaan
Published in Journal of electronic testing (01.02.2020)

by Rahbari, Dadmehr, Alam, Muhammad Mahtab, Moullec, Yannick Le, Jenihhin, Maksim
Published in IEEE access (2021)

by Cherezova, Natalia, Shibin, Konstantin, Jenihhin, Maksim, Jutman, Artur
Published in Microelectronics and reliability (01.07.2023)

by Jenihhin, Maksim, Raik, Jaan, Chepurov, Anton, Ubar, Raimund
Published in Estonian journal of engineering (01.03.2010)

by Jervan, Gert, Eles, Petru, Peng, Zebo, Ubar, Raimund, Jenihhin, Maksim
Published in Journal of computer science and technology (01.11.2006)

by Rahbari, Dadmehr, Ahmed, Foisal, Jenihhin, Maksim, Alam, Muhammad Mahtab, Le Moullec, Yannick
Published in IEEE systems journal (31.07.2024)

by Selg, Hardi, Jenihhin, Maksim, Ellervee, Peeter
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)

by Avramenko, Serhiy, Azad, Siavoosh Payandeh, Esposito, Stefano, Niazmand, Behrad, Violante, Massimo, Raik, Jaan, Jenihhin, Maksim
Published in 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) (01.04.2018)

by Jürimägi, Lembit, Ubar, Raimund, Jenihhin, Maksim, Raik, Jaan
Published in Microprocessors and microsystems (01.09.2020)

by Heidari Iman, Mohammad Reza, Raik, Jaan, Jenihhin, Maksim, Jervan, Gert, Ghasempouri, Tara
Published in Microprocessors and microsystems (01.03.2023)

by Lai, Xinhui, Balakrishnan, Aneesh, Lange, Thomas, Jenihhin, Maksim, Ghasempouri, Tara, Raik, Jaan, Alexandrescu, Dan
Published in Microprocessors and microsystems (01.11.2019)

by Jenihhin, Maksim, Reorda, Matteo Sonza, Balakrishnan, Aneesh, Alexandrescu, Dan
Published in 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2019)

by Ubar, Raimund, Kostin, Sergei, Jenihhin, Maksim, Raik, Jaan, Jürimägi, Lembit
Published in Microelectronics and reliability (01.02.2018)

by Ahmadilivani, Mohammad Hasan, Barbareschi, Mario, Barone, Salvatore, Bosio, Alberto, Daneshtalab, Masoud, Torca, Salvatore Della, Gavarini, Gabriele, Jenihhin, Maksim, Raik, Jaan, Ruospo, Annachiara, Sanchez, Ernesto, Taheri, Mahdi
Published in 2023 IEEE 41st VLSI Test Symposium (VTS) (24.04.2023)

by Bagbaba, Ahmet Cagri, Augusto da Silva, Felipe, Sonza Reorda, Matteo, Hamdioui, Said, Jenihhin, Maksim, Sauer, Christian
Published in Electronics (Basel) (01.02.2022)

by Balakrishnan, Aneesh, Medeiros, Guilherme Cardoso, Gursoy, Cemil Cem, Hamdioui, Said, Jenihhin, Maksim, Alexandrescu, Dan
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)

by Naqvi, Syed Rameez, Zahid, Anjum, Sawalha, Lina, Naqvi, Syed Saud, Akram, Tallha, Haider, Sajjad Ali, Yelamarthi, Kumar, Jenihhin, Maksim
Published in Computers & electrical engineering (01.09.2019)