Synthesis of nanocomposite materials with controlled structures and optical emissions: application of various methacrylate polymers for CdSe quantum dots encapsulation
Vassiltsova, Oxana V, Jayez, David A, Zhao, Zhouying, Carpenter, Michael A, Petrukhina, Marina A
Published in Journal of nanoscience and nanotechnology (01.03.2010)
Published in Journal of nanoscience and nanotechnology (01.03.2010)
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Journal Article
Wafer backside cleaning for defect reduction and litho hot spots mitigation: DI: Defect inspection and reduction
Balu, Elango, Tseng, Wei-Tsu, Jayez, David, Mody, Jay, Donegan, Keith
Published in 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.04.2018)
Published in 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.04.2018)
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Conference Proceeding
Metrology manufacturing control factors: A holistic approach for supporting 14nm and 7nm
Jayez, David, Vaid, Alok, Solecky, Eric, Lenahan, Michael, Dixit, Dhairya, Largo, Charles, Vakas, Georgios, Seipp, Steve
Published in 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2017)
Published in 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2017)
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Conference Proceeding
Manufacturing excellence using multi-platform ellipsometry thickness measurement fleet on advanced nodes
Lenahan, Michael, Vaid, Alok, Mahendrakar, Sridhar, Seipp, Steven, Jayez, David, Yueh, Alice, Saxena, Shweta, Solecky, Eric, Gizzi, Samuel, Heller, Amir, Zhang, Tianhao, Song, Da, Yoon, Nam Hee, Camp, Janay, Venkataraman, Kartik
Published in 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2016)
Published in 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2016)
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Conference Proceeding
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