by Leurquin, C., Vandendaele, W., Jaud, M.-A., Lavieville, R., Mohamad, B., Masante, C., Despesse, G., Nowak, E.
Published in IEEE transactions on electron devices (01.05.2024)

by Lacord, J., Martinie, S., Rozeau, O., Jaud, M.-A, Barraud, S., Barbe, J. C.
Published in IEEE transactions on electron devices (01.02.2016)

by Viey, A. G., Vandendaele, W., Jaud, M.-A., Gerrer, L., Garros, X., Cluzel, J., Martin, S., Krakovinsky, A., Biscarrat, J., Gwoziecki, R., Plissonnier, M., Gaillard, F., Modica, R., Iucolano, F., Meneghini, M., Meneghesso, G., Ghibaudo, G.
Published in IEEE transactions on electron devices (01.04.2021)

by Navarro, C., Barraud, S., Martinie, S., Lacord, J., Jaud, M.-A., Vinet, M.
Published in Solid-state electronics (01.02.2017)

by Piotrowicz, C., Mohamad, B., Malbert, N., Jaud, M.-A., Vandendaele, W., Charles, M., Gwoziecki, R.
Published in Solid-state electronics (01.03.2023)

by Jaud, M. -A., Vandendaele, W., Rrustemi, B., Viey, A. G., Martin, S., Le Royer, C., Vauche, L., Martinie, S., Gwoziecki, R., Modica, R., Iucolano, F., Poiroux, T.
Published in IEEE transactions on electron devices (01.02.2022)

by Piotrowic, C., Mohamad, B., Rocha, P. Fernandes Paes Pinto, Malbert, N., Ruel, S., Pimenta-Barros, P., Jaud, M.-A., Vauche, L., Royer, C. Le
Published in 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (28.05.2023)

by Jaud, M. -A., Vandendaele, W., Rrustemi, B., Viey, A. G., Martin, S., Le Royer, C., Vauche, L., Martinie, S., Morvan, E., Gwoziecki, R., Modica, R., Iucolano, F., Plissonnier, M., Poiroux, T.
Published in 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (30.05.2021)

by NIEBOJEWSKI, H, LE ROYER, C, MORAND, Y, ROZEAU, O, JAUD, M.-A, DUBOIS, E, POIROUX, T, BENSAHEL, D
Published in Solid-state electronics (01.07.2014)

by Grandchamp, B., Jaud, M.-A., Scheiblin, P., Romanjek, K., Hutin, L., Le Royer, C., Vinet, M.
Published in Solid-state electronics (01.03.2011)

by Viey, A.G., Vandendaele, W., Jaud, M.-A., Coignus, J., Cluzel, J., Krakovinsky, A., Martin, S., Biscarrat, J., Gwoziecki, R., Sousa, V., Gaillard, F., Modica, R., Iucolano, F., Meneghini, M., Meneghesso, G., Ghibaudo, G.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)

by Lacord, J., Jaud, M-A, Poiroux, T., Barbe, J-C
Published in 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2017)

by Romanjek, K., Hutin, L., Le Royer, C., Pouydebasque, A., Jaud, M.-A., Tabone, C., Augendre, E., Sanchez, L., Hartmann, J.-M., Grampeix, H., Mazzocchi, V., Soliveres, S., Truche, R., Clavelier, L., Scheiblin, P., Garros, X., Reimbold, G., Vinet, M., Boulanger, F., Deleonibus, S.
Published in Solid-state electronics (01.07.2009)

by Jaud, M.-A, Baines, Y., Charles, M., Morvan, E., Scheiblin, P., Torres, A., Plissonnier, M., Barbe, J.-C
Published in 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2017)

by Gaben, Loïc, Barraud, Sylvain, Samson, Marie-Pierre, Jaud, Marie-Anne, Martinie, Sébastien, Rozeau, Olivier, Lacord, Joris, Arvet, Christian, Vizioz, Christian, Bustos, Jessy, Dallery, Jacques-Alexandre, Pauliac, Sébastien, Balan, Viorel, Euvrard-Colnat, Catherine, Perrot, Cédric, Loup, Virginie, Besson, Pascal, Hartmann, Jean-Michel, Monfray, Stéphane, Boeuf, Frédéric, Skotnicki, Thomas, Balestra, Francis, Vinet, Maud
Published in ECS transactions (04.05.2016)

by Rrustemi, B., Piotrowicz, C., Jaud, M-A., Triozon, F., Vandendaele, W., Mohamad, B., Gwoziecki, R., Ghibaudo, G.
Published in Solid-state electronics (01.08.2022)

by Tavernier, C., Pereira, F. G., Nier, O., Rideau, D., Monsieur, F., Torrente, G., Haond, M., Jaouen, H., Noblanc, O., Niquet, Y. M., Jaud, M.-A, Triozon, F., Casse, M., Lacord, J., Barbe, J. C.
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)

by Barraud, S., Lapras, V., Previtali, B., Samson, M. P., Lacord, J., Martinie, S., Jaud, M.-A, Athanasiou, S., Triozon, F., Rozeau, O., Hartmann, J. M., Vizioz, C., Comboroure, C., Andrieu, F., Barbe, J. C., Vinet, M., Ernst, T.
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)

by Martinie, S., Rozeau, O., Le Royer, C., Lacord, J., Jaud, M.-A, Poiroux, T., Le Carval, G., Barbe, J.-C
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)

by Oudrhiri, A. Idrissi-El, Martinie, S., Barbe, J.-C, Rozeau, O., Le Royer, C., Jaud, M.-A, Lacord, J., Bernier, N., Grenouillet, L., Rivallin, P., Pelloux-Prayer, J., Casse, M., Mouis, M.
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)