Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry
Petrik, P., Gumprecht, T., Nutsch, A., Roeder, G., Lemberger, M., Juhasz, G., Polgar, O., Major, C., Kozma, P., Janosov, M., Fodor, B., Agocs, E., Fried, M.
Published in Thin solid films (01.08.2013)
Published in Thin solid films (01.08.2013)
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Conference Proceeding
New [47,15,16] Linear Binary Block Code
Janosov, M., Husak, M., Farkas, P., Armada, A.G.
Published in IEEE transactions on information theory (01.01.2008)
Published in IEEE transactions on information theory (01.01.2008)
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