Highly luminescent near-infrared Cu-doped InP quantum dots with a Zn-Cu-In-S/ZnS double shell scheme
Kim, Jiyong, Choi, Hyung Seok, Wedel, Armin, Yoon, Suk-Young, Jo, Jung-Ho, Kim, Hyun-Min, Han, Chul-Jong, Song, Hong-Joo, Yi, Jeong-Min, Jang, Jong-Shik, Zschiesche, Hannes, Lee, Bum-Joo, Park, Kyoungwon, Yang, Heesun
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (01.04.2021)
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (01.04.2021)
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Journal Article
In situ control of oxygen vacancies in TiO2 by atomic layer deposition for resistive switching devices
Park, Sang-Joon, Lee, Jeong-Pyo, Jang, Jong Shik, Rhu, Hyun, Yu, Hyunung, You, Byung Youn, Kim, Chang Soo, Kim, Kyung Joong, Cho, Yong Jai, Baik, Sunggi, Lee, Woo
Published in Nanotechnology (26.07.2013)
Published in Nanotechnology (26.07.2013)
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Journal Article
In Situ Determination of the Pore Opening Point during Wet-Chemical Etching of the Barrier Layer of Porous Anodic Aluminum Oxide: Nonuniform Impurity Distribution in Anodic Oxide
Han, Hee, Park, Sang-Joon, Jang, Jong Shik, Ryu, Hyun, Kim, Kyung Joong, Baik, Sunggi, Lee, Woo
Published in ACS applied materials & interfaces (24.04.2013)
Published in ACS applied materials & interfaces (24.04.2013)
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Journal Article
Determination of the Absolute Thickness of Ultrathin Al2O3 Overlayers on Si (100) Substrate
Kim, Kyung Joong, Jang, Jong Shik, Lee, Joo-Hee, Jee, Yun-Jung, Jun, Chung-Sam
Published in Analytical chemistry (Washington) (15.10.2009)
Published in Analytical chemistry (Washington) (15.10.2009)
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Journal Article
Accurate quantification of Cu(In,Ga)Se2 films by AES depth profiling analysis
Jang, Jong Shik, Hwang, Hye Hyen, Kang, Hee Jae, Chae, Hong-Chol, Chung, Yong-Duck, Kim, Kyung Joong
Published in Applied surface science (01.10.2013)
Published in Applied surface science (01.10.2013)
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Journal Article
SIMS depth profiling analysis of P-doped n-type Si layer to develop the Si QD solar cell
Kim, Tae Woon, Baek, Hyun Jeong, Jang, Jong Shik, Lee, Seung Mi, Kim, Kyung Joong
Published in Surface and interface analysis (01.11.2014)
Published in Surface and interface analysis (01.11.2014)
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Journal Article
A method to determine the interface position and layer thickness in SIMS depth profiling of multilayer films
Kim, Kyung Joong, Jang, Jong Shik, Moon, Dae Won, Kang, Hee Jae
Published in Metrologia (01.06.2010)
Published in Metrologia (01.06.2010)
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Journal Article
CCQM pilot study CCQM-P140: quantitative surface analysis of multi-element alloy films
Kim, Kyung Joong, Jang, Jong Shik, Kim, An Soon, Suh, Jung Ki, Chung, Yong-Duck, Hodoroaba, Vasile-Dan, Wirth, Thomas, Unger, Wolfgang, Kang, Hee Jae, Popov, Oleg
Published in Metrologia (01.01.2015)
Published in Metrologia (01.01.2015)
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Journal Article
A mutual calibration method to certify the thickness of nanometre oxide films
Kim, Kyung Joong, Kim, Yong-Sung, Jang, Jong Shik, Kim, Jeong Won, Kim, Kyoung Won
Published in Metrologia (01.10.2008)
Published in Metrologia (01.10.2008)
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Journal Article
QUANTIFICATION AND IN-DEPTH COMPOSITIONAL PROFILING METHODS FOR THE MAIN COMPONENTS OF MULTI-COMPONENT ALLOY FILMS BY SECONDARY ION MASS SPECTROMETRY USING TOTAL NUMBER COUNTING METHOD
KIM, KYUNG JOONG, HAN, MYUNG SUB, MIN, HYUNG SIK, JANG, JONG SHIK, CHO, KYUNG HAENG
Year of Publication 01.09.2011
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Year of Publication 01.09.2011
Patent
Mechanism of abnormal interface artifacts in SIMS depth profiling of a Si/Ge multilayer by oxygen ions
Jang, Jong Shik, Kang, Hee Jae, Kim, Kyung Joong
Published in Surface and interface analysis (01.11.2014)
Published in Surface and interface analysis (01.11.2014)
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Journal Article
Round‐robin test for the measurement of layer thickness of multilayer films by secondary ion mass spectrometry depth profiling
Kim, Kyung Joong, Jang, Jong Shik, Bennett, Joe, Simons, David, Barozzi, Mario, Takano, Akio, Li, Zhanping, Magee, Charles
Published in Surface and interface analysis (01.11.2017)
Published in Surface and interface analysis (01.11.2017)
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Journal Article
Active doping of B in silicon nanostructures and development of a Si quantum dot solar cell
Hong, Seung Hui, Kim, Yong Sung, Lee, Woo, Kim, Young Heon, Song, Jae Yong, Jang, Jong Shik, Park, Jae Hee, Choi, Suk-Ho, Kim, Kyung Joong
Published in Nanotechnology (21.10.2011)
Published in Nanotechnology (21.10.2011)
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Journal Article