Online Calibration for LTE-Based Antenna Array System
Choi, Seungwon, Sun, Tiefeng, Jang, Jaehyun, Yang, Hyunwook, Kim, Kyunghoon, Jung, Jaeho
Published in International journal of antennas and propagation (01.01.2016)
Published in International journal of antennas and propagation (01.01.2016)
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Journal Article
Transparent session transfer in converged IP Messaging systems
Youngsub Kwon, Jaehyun Jang, Hyunwoo Lee, Haewook Lee, Bummo Koo, Wuk Kim, Hyeonsang Eom
Published in 2010 Wireless Telecommunications Symposium (WTS) (01.04.2010)
Published in 2010 Wireless Telecommunications Symposium (WTS) (01.04.2010)
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Conference Proceeding
Multimodal Volume Data Exploration through Mid-Air Haptics
Jang, Jaehyun, Frier, William, Park, Jinah
Published in 2022 IEEE International Symposium on Mixed and Augmented Reality (ISMAR) (01.10.2022)
Published in 2022 IEEE International Symposium on Mixed and Augmented Reality (ISMAR) (01.10.2022)
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Conference Proceeding
Understanding the different effects of fouling mechanisms on working and reference electrodes in fast-scan cyclic voltammetry for neurotransmitter detection
Jang, Jaehyun, Cho, Hyun-U, Hwang, Sangmun, Kwak, Youngjong, Kwon, Haeun, Heien, Michael L, Bennet, Kevin E, Oh, Yoonbae, Shin, Hojin, Lee, Kendall H, Jang, Dong Pyo
Published in Analyst (London) (13.05.2024)
Published in Analyst (London) (13.05.2024)
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Journal Article
Calibration method using the Zadoff-Chu sequence
Hyunwook Yang, Jaehyun Jang, Tiefeng Sun, Kyunghoon Kim, Seungwon Choi
Published in 2013 International Conference on ICT Convergence (ICTC) (01.10.2013)
Published in 2013 International Conference on ICT Convergence (ICTC) (01.10.2013)
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Conference Proceeding
Combining Topological & Physical Pattern Recognition To Enhance Memory Chip Reliability
Hany, Sherif, Byun, Sunsoo, Sarhan, Hossam, Medhat, Dina, ElRefaee, Mohamed, Jang, Jaehyun, Jeong, Baekryong, Choi, Hyunseung, Choi, Sunmi, Muirhead, Jonathan, Hogan, Matthew
Published in 2020 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2020)
Published in 2020 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2020)
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Conference Proceeding