Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments
Warmuth, J., Giering, K.-U., Lange, A., Clausner, A., Schlipf, S., Kurz, G., Otto, M., Paul, J., Jancke, R., Aal, A., Gall, M., Zschech, E.
Published in 2018 48th European Solid-State Device Research Conference (ESSDERC) (01.09.2018)
Published in 2018 48th European Solid-State Device Research Conference (ESSDERC) (01.09.2018)
Get full text
Conference Proceeding
Analog-circuit NBTI degradation and time-dependent NBTI variability: An efficient physics-based compact model
Giering, K.-U, Rott, G., Rzepa, G., Reisinger, H., Puppala, A. K., Reich, T., Gustin, W., Grasser, T., Jancke, R.
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Get full text
Conference Proceeding
Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation
Clausner, A., Schlipf, S., Kurz, G., Otto, M., Paul, J., Giering, K.-U., Warmuth, J., Lange, A., Jancke, R., Aal, A., Rosenkranz, R., Gall, M., Zschech, E.
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Get full text
Conference Proceeding
Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results
Lorenz, J. K., Bar, E., Clees, T., Evanschitzky, P., Jancke, R., Kampen, C., Paschen, U., Salzig, C. P. J., Selberherr, S.
Published in IEEE transactions on electron devices (01.08.2011)
Published in IEEE transactions on electron devices (01.08.2011)
Get full text
Journal Article
Generator based approach for analog circuit and layout design and optimization
Graupner, A, Jancke, R, Wittmann, R
Published in 2011 Design, Automation & Test in Europe (01.03.2011)
Published in 2011 Design, Automation & Test in Europe (01.03.2011)
Get full text
Conference Proceeding
A general approach for multivariate statistical MOSFET compact modeling preserving correlations
Lange, A., Sohrmann, C., Jancke, R., Haase, J., Binjie Cheng, Kovac, U., Asenov, A.
Published in 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) (01.09.2011)
Published in 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) (01.09.2011)
Get full text
Conference Proceeding
System-level time-domain behavioral baseband modeling of RF blocks for mixed-signal simulation
Harasymiv, I., Jancke, R.
Published in 2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.09.2012)
Published in 2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.09.2012)
Get full text
Conference Proceeding
Simulation of electro-thermal interaction
Jancke, R, Wilde, A, Martin, R, Reitz, S, Schneider, P
Published in 3rd Electronics System Integration Technology Conference ESTC (01.09.2010)
Published in 3rd Electronics System Integration Technology Conference ESTC (01.09.2010)
Get full text
Conference Proceeding