Circuit Modeling of High-Frequency Electrical Conduction in Carbon Nanofibers
Madriz, F.R., Jameson, J.R., Krishnan, S., Xuhui Sun, Yang, C.Y.
Published in IEEE transactions on electron devices (01.08.2009)
Published in IEEE transactions on electron devices (01.08.2009)
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Journal Article
Towards Automotive Grade Embedded RRAM
Jameson, J.R., Dinh, J., Gonzales, N., Hollmer, S., Hsu, S., Kim, D., Koushan, F., Lewis, D., Runnion, E., Shields, J., Tysdal, A., Wang, D., Gopinath, V.
Published in 2018 48th European Solid-State Device Research Conference (ESSDERC) (01.09.2018)
Published in 2018 48th European Solid-State Device Research Conference (ESSDERC) (01.09.2018)
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Conference Proceeding
Charge trapping in high-k gate stacks due to the bilayer structure itself
JAMESON, John R, GRIFFIN, Peter B, PLUMMER, James D, NISHI, Y
Published in IEEE transactions on electron devices (01.08.2006)
Published in IEEE transactions on electron devices (01.08.2006)
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Journal Article
Impact of hydrogen on the electroforming of Pr0.7Ca0.3MnO3 resistance-change memory devices
Tendulkara, M.P., Jameson, J.R., Griffin, P.B., McVittie, J.P., Nishi, Y.
Published in 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS) (01.10.2009)
Published in 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS) (01.10.2009)
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Conference Proceeding
Charge Trapping in High- kGate Stacks Due to the Bilayer Structure Itself
Jameson, J.R., Griffin, P.B., Plummer, J.D., Nishi, Y.
Published in IEEE transactions on electron devices (01.08.2006)
Published in IEEE transactions on electron devices (01.08.2006)
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Journal Article
Charge Trapping in High- Gate Stacks Due to the Bilayer Structure Itself
Jameson, J.R, Griffin, P.B, Plummer, J.D, Nishi, Y
Published in IEEE transactions on electron devices (01.08.2006)
Published in IEEE transactions on electron devices (01.08.2006)
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Journal Article
Test Structure to Extract Circuit Models of Nanostructures Operating at High Frequencies
Madriz, F.R., Jameson, J.R., Krishnan, S., Xuhui Sun, Yang, C.Y.
Published in 2009 IEEE International Conference on Microelectronic Test Structures (01.03.2009)
Published in 2009 IEEE International Conference on Microelectronic Test Structures (01.03.2009)
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Conference Proceeding
Ultra-high bandwidth memory with 3D-stacked emerging memory cells
Abe, K., Tendulkar, M.P., Jameson, J.R., Griffin, P.B., Nomura, K., Fujita, S., Nishi, Y.
Published in 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial (01.06.2008)
Published in 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial (01.06.2008)
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Conference Proceeding
Problems with metal-oxide high-/spl kappa/ dielectrics due to 1/t dielectric relaxation current in amorphous materials
Jameson, J.R., Griffin, P.B., Agah, A., Plummer, J.D., Kim, H.-S., Taylor, D.V., McIntyre, P.C., Harrison, W.A.
Published in IEEE International Electron Devices Meeting 2003 (2003)
Published in IEEE International Electron Devices Meeting 2003 (2003)
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Conference Proceeding