Revisiting Lateral-BTBT Gate-Induced Drain Leakage in Nanowire FETs for 1T-DRAM
Bashir, Md Yasir, Jaiswal, Anupam Kumar, Patel, Sharang Dhar, Sahay, Shubham
Published in IEEE transactions on electron devices (01.04.2024)
Published in IEEE transactions on electron devices (01.04.2024)
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