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Analysis and comparison of different methods used to extract isoclinic and isochromatic parameters. Application to the determination of the residual stresses inside crystal silicon wafers
by
Jagailloux
,
F
.
,
Valle, V.
Published in
Strain
(01.08.2018)
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Applied Photoelasticity for Residual Stress Measurement inside Crystal Silicon Wafers for Solar Applications
by
Jagailloux
,
F
.
,
Valle, V.
,
Dupré, J.-C.
,
Penot, J.-D.
,
Chabli, A.
Published in
Strain
(01.08.2016)
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engineering
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physics
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materials science
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materials science, characterization & testing
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photoelasticity
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physics
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residual stress
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science & technology
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