A New Accelerated Endurance Test for Terabit NAND Flash Memory Using Interference Effect
Jaewon Cha, Wooheon Kang, Junsub Chung, Kunwoo Park, Sungho Kang
Published in IEEE transactions on semiconductor manufacturing (01.08.2015)
Published in IEEE transactions on semiconductor manufacturing (01.08.2015)
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Journal Article
Low Cost Endurance Test-pattern Generation for Multi-level Cell Flash Memory
Cha, Jaewon, Cho, Keewon, Yu, Seunggeon, Kang, Sungho
Published in Journal of semiconductor technology and science (01.02.2017)
Published in Journal of semiconductor technology and science (01.02.2017)
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Journal Article
New Fault Detection Algorithm for Multi-level Cell Flash Memroies
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