Effect of fluorine implantation on recovery characteristics of p-channel MOSFET after negative bias temperature instability stress
Oh, Sun-Ho, Kwon, Hyuk-Min, Kwon, Sung-Kyu, Sung, Seung-Yong, Yu, Jae-Nam, Lee, Ga-Won, Lee, Hi-Deok
Published in Japanese Journal of Applied Physics (01.08.2014)
Published in Japanese Journal of Applied Physics (01.08.2014)
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Journal Article
Decrease of Parasitic Capacitance for Improvement of RF Performance of Multi-finger MOSFETs in 90-nm CMOS Technology
Jang, Seong-Yong, Kwon, Sung-Kyu, Shin, Jong-Kwan, Yu, Jae-Nam, Oh, Sun-Ho, Jeong, Jin-Woong, Song, Hyeong-Sub, Kim, Choul-Young, Lee, Ga-Won, Lee, Hi-Deok
Published in Journal of semiconductor technology and science (01.04.2015)
Published in Journal of semiconductor technology and science (01.04.2015)
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Journal Article
A novel BJT structure for high- performance analog circuit applications
Seon-Man Hwang, Hyuk-Min Kwon, Jae-Hyung Jang, Ho-Young Kwak, Sung-Kyu Kwon, Seung-Yong Sung, Jong-Kwan Shin, Jae-Nam Yu, In-Shik Han, Yi-Sun Chung, Jung-Hwan Lee, Ga-Won Lee, Hi-Deok Lee
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
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Conference Proceeding
Modeling of T-model equivalent circuit for spiral inductors in 90 nm CMOS technology
Jeong, Jin-Woong, Kwon, Sung-Kyu, Yu, Jae-Nam, Jang, Seong-Yong, Oh, Sun-Ho, Kim, Choul-Young, Lee, Ga-won, Lee, Hi-Deok
Published in Proceedings of the 2015 International Conference on Microelectronic Test Structures (01.03.2015)
Published in Proceedings of the 2015 International Conference on Microelectronic Test Structures (01.03.2015)
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Conference Proceeding
Journal Article