What Lies Ahead for Resistance-Based Memory Technologies?
Song, Yoon-Jong, Jeong, Gitae, Baek, In-Gyu, Choi, Jungdal
Published in Computer (Long Beach, Calif.) (01.08.2013)
Published in Computer (Long Beach, Calif.) (01.08.2013)
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Journal Article
3D approaches for non-volatile memory
Jungdal Choi, Kwang Soo Seol
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
Conference Proceeding
Stacked Gated Twin-Bit (SGTB) SONOS Memory Device for High-Density Flash Memory
SHIM, Won Bo, CHO, Seongjae, PARK, Byung-Gook, LEE, Jung Hoon, LI, Dong Hua, KIM, Doo-Hyun, LEE, Gil Sung, KIM, Yoon, PARK, Se Hwan, KIM, Wandong, CHOI, Jungdal
Published in IEEE transactions on nanotechnology (01.03.2012)
Published in IEEE transactions on nanotechnology (01.03.2012)
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Journal Article
Effects of Lateral Charge Spreading on the Reliability of TANOS (TaN/AlO/SiN/Oxide/Si) NAND Flash Memory
Changseok Kang, Jungdal Choi, Jaesung Sim, Changhyun Lee, Yoocheol Shin, Jintaek Park, Jongsun Sel, Sanghun Jeon, Youngwoo Park, Kinam Kim
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Conference Proceeding
Highly scalable NAND flash memory with robust immunity to program disturbance using symmetric inversion-type source and drain structure
Chang-Hyun Lee, Jungdal Choi, Youngwoo Park, Changseok Kang, Byeong-In Choi, Hyunjae Kim, Hyunsil Oh, Won-Seong Lee
Published in 2008 Symposium on VLSI Technology (01.06.2008)
Published in 2008 Symposium on VLSI Technology (01.06.2008)
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Conference Proceeding
Highly reliable vertical NAND technology with biconcave shaped storage layer and leakage controllable offset structure
Won-seok Cho, Sun Il Shim, Jaehoon Jang, Hoo-sung Cho, Byoung-Koan You, Byoung-Keun Son, Ki-hyun Kim, Jae-Joo Shim, Choul-min Park, Jin-soo Lim, Kyoung-Hoon Kim, De-will Chung, Ju-Young Lim, Hui-Chang Moon, Sung-min Hwang, Hyun-seok Lim, Han-Soo Kim, Jungdal Choi, Chilhee Chung
Published in 2010 Symposium on VLSI Technology (01.06.2010)
Published in 2010 Symposium on VLSI Technology (01.06.2010)
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Conference Proceeding
A new floating gate cell structure with a silicon-nitride cap layer for sub-20 nm NAND flash memory
Kwang Soo Seol, Heesoo Kang, Jaeduk Lee, Hyunsuk Kim, Byungkyu Cho, Dohyun Lee, Yong-Lack Choi, Nok-Hyun Ju, Changmin Choi, SungHoi Hur, Jungdal Choi, Chilhee Chung
Published in 2010 Symposium on VLSI Technology (01.06.2010)
Published in 2010 Symposium on VLSI Technology (01.06.2010)
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Conference Proceeding
New phenomena for the Lifetime Prediction of TANOS-based Charge Trap NAND Flash Memory
Juhyung Kim, Changseok Kang, Sung-Il Chang, Jongyeon Kim, Younseok Jeong, Chan Park, Joo-Heon Kang, Sang-Hoon Kim, Sunkyu Hwang, Byeong-In Choe, Jintaek Park, Juhyuck Chung, Youngwoo Park, Jungdal Choi, Chilhee Chung
Published in 68th Device Research Conference (01.06.2010)
Published in 68th Device Research Conference (01.06.2010)
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Conference Proceeding
A non-linear ReRAM cell with sub-1μA ultralow operating current for high density vertical resistive memory (VRRAM)
Seong-Geon Park, Min Kyu Yang, Hyunsu Ju, Dong-Jun Seong, Jung Moo Lee, Eunmi Kim, Seungjae Jung, Lijie Zhang, Yoo Cheol Shin, In-Gyu Baek, Jungdal Choi, Ho-Kyu Kang, Chilhee Chung
Published in 2012 International Electron Devices Meeting (01.12.2012)
Published in 2012 International Electron Devices Meeting (01.12.2012)
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Conference Proceeding
Comparison of double patterning technologies in NAND flash memory with sub-30nm node
Byungjoon Hwang, Jeehoon Han, Myeong-Cheol Kim, Sunggon Jung, Namsu Lim, Sowi Jin, Yongsik Yim, Donghwa Kwak, Jaekwan Park, Jungdal Choi, Kinam Kim
Published in 2009 Proceedings of the European Solid State Device Research Conference (01.09.2009)
Published in 2009 Proceedings of the European Solid State Device Research Conference (01.09.2009)
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Conference Proceeding
Future Outlook of NAND Flash Technology for 40nm Node and Beyond
Kinam Kim, Jungdal Choi
Published in 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop (2006)
Published in 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop (2006)
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Conference Proceeding
A practical Si nanowire technology with nanowire-on-insulator structure for beyond 10nm logic technologies
Hur, Sung-Gi, Yang, Jung-Gil, Kim, Sang-Su, Lee, Dong-Kyu, An, Taehyun, Nam, Kab-Jin, Kim, Seong-Je, Wu, Zhenhua, Lee, Wonsok, Kwon, Uihui, Lee, Keun-Ho, Park, Youngkwan, Yang, Wouns, Choi, Jungdal, Kang, Ho-Kyu, Jung, EunSung
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)
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Conference Proceeding
Journal Article
What Lies Ahead for Resistance-Based Memory Technologies? : Next-Generation Memory
SONG, Yoon-Jong, GITAE JEONG, BAEK, In-Gyu, JUNGDAL CHOI
Published in Computer (Long Beach, Calif.) (2013)
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Published in Computer (Long Beach, Calif.) (2013)
Journal Article
Endurance Prediction of Scaled NAND Flash Memory Based on Spatial Mapping of Erase Tunneling Current
Fayrushin, A, ChangHyun Lee, Youngwoo Park, Jungdal Choi, Jeonghyuk Choi, Chilhee Chung
Published in 2011 3rd IEEE International Memory Workshop (IMW) (01.05.2011)
Published in 2011 3rd IEEE International Memory Workshop (IMW) (01.05.2011)
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Conference Proceeding
28.2 A High-Performance 1Tb 3b/Cell 3D-NAND Flash with a 194MB/s Write Throughput on over 300 Layers \mathsf
Kim, Bvunarvul, Lee, Seungpil, Hah, Beomseok, Park, Kanawoo, Park, Yongsoon, Jo, Kangwook, Noh, Yujong, Seol, Hyeoncheon, Lee, Hyunsoo, Shin, Jaehyeon, Choi, Seongjin, Jung, Youngdon, Ahn, Sungho, Park, Yonghun, Oh, Sujeong, Kim, Myungsu, Kim, Seonauk, Park, Hyunwook, Lee, Taeho, Won, Haeun, Kim, Minsung, Koo, Cheulhee, Choi, Yeonjoo, Choi, Suyoung, Park, Sechun, Youn, Dongkyu, Lim, Junyoun, Park, Wonsun, Hur, Hwang, Kwean, Kichang, Choi, Hongsok, Jeong, Woopyo, Chung, Sungyong, Choi, Jungdal, Cha, Seonyong
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)
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Conference Proceeding
Physical Modeling and Analysis on Improved Endurance Behavior of P-Type Floating Gate NAND Flash Memory
ChangHyun Lee, Fayrushin, A., Sunghoi Hur, Youngwoo Park, Jungdal Choi, Jeonghyuk Choi, Chilhee Chung
Published in 2012 4th IEEE International Memory Workshop (01.05.2012)
Published in 2012 4th IEEE International Memory Workshop (01.05.2012)
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Conference Proceeding
A New Cell-to-Cell Interference Induced by Conduction Band Distortion near S/D Region in Scaled NAND Flash Memories
Byungkyu Cho, ChangHyun Lee, Kwangsoo Seol, Sunghoi Hur, Jungdal Choi, Jeonghyuk Choi, Chilhee Chung
Published in 2011 3rd IEEE International Memory Workshop (IMW) (01.05.2011)
Published in 2011 3rd IEEE International Memory Workshop (IMW) (01.05.2011)
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Conference Proceeding
A New Cell-Type String Select Transistor in NAND Flash Memories for under 20nm Node
Do-Hyune Lee, Yoocheol Shin, Donghoon Jang, Changhyun Lee, Joon-Hee Lee, Jungdal Choi, Seong-Soon Cho, Jeong-Hyuk Choi
Published in 2012 4th IEEE International Memory Workshop (01.05.2012)
Published in 2012 4th IEEE International Memory Workshop (01.05.2012)
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Conference Proceeding
A 1-Tb, 4b/Cell, 176-Stacked-WL 3D-NAND Flash Memory with Improved Read Latency and a 14.8Gb/mm2 Density
Cho, Wanik, Jung, Jongseok, Kim, Jongwoo, Ham, Junghoon, Lee, Sangkyu, Noh, Yujong, Kim, Dauni, Lee, Wanseob, Cho, Kayoung, Kim, Kwanho, Lee, Heejoo, Chai, Sooyeol, Jo, Eunwoo, Cho, Hanna, Kim, Jong-Seok, Kwon, Chankeun, Park, Cheolioona, Nam, Hveonsu, Won, Haeun, Kim, Taeho, Park, Kyeonghwan, Oh, Sanghoon, Ban, Jinhyun, Park, Junyoung, Shin, Jaehyeon, Shin, Taisik, Jang, Junseo, Mun, Jiseong, Choi, Jehyun, Choi, Hyunseung, Choi, Suna-Wook, Park, Wonsun, Yoon, Dongkvu, Kim, Minsu, Lim, Junvoun, An, Chiwook, Shirr, Hyunyoung, Oh, Haesoon, Park, Haechan, Shim, Sungbo, Huh, Hwang, Choi, Honasok, Lee, Seungpil, Sim, Jaesuna, Gwon, Kichana, Kim, Jumsoo, Jeong, Woopyo, Choi, Jungdal, Jin, Kyo-Won
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)
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Conference Proceeding