Effective defect detection in thin film transistor liquid crystal display images using adaptive multi-level defect detection and probability density function
Kim, Se-Yun, Song, Young-Chul, Jung, Chang-Do, Park, Kil-Houm
Published in Optical review (Tokyo, Japan) (01.03.2011)
Published in Optical review (Tokyo, Japan) (01.03.2011)
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Journal Article
로컬 영역 간 평균 화소값 차를 이용한 멀티스케일 기반의 TFT-LCD 결함 검출
정창도(Chang-Do Jung), 이승민(Seung Min Lee), 윤병주(Byoung-Ju Yun), 이준재(Joon-Jae Lee), 최일(Il-Choi), 박길흠(Kil-Houm Park)
Published in 멀티미디어학회논문지 (2012)
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Published in 멀티미디어학회논문지 (2012)
Journal Article
Fourier spectrum based periodic cell pattern elimination in thin film transistor liquid crystal display cell image
Chang-Do Jung, Se-Yun Kim, Hee-Yul Lee, Byoung-Ju Yun, Joon-Jae Lee, Young-Do Lim, Kil-Houm Park
Published in 2011 IEEE International Conference on Consumer Electronics (ICCE) (01.01.2011)
Published in 2011 IEEE International Conference on Consumer Electronics (ICCE) (01.01.2011)
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Conference Proceeding