A 1.2 V 30 nm 3.2 Gb/s/pin 4 Gb DDR4 SDRAM With Dual-Error Detection and PVT-Tolerant Data-Fetch Scheme
SOHN, Kyomin, NA, Taesik, LEE, Ki-Won, PARK, Jun-Seok, LEE, Jongeun, LEE, Byunghyun, JUN, Inwoo, PARK, Juseop, PARK, Junghwan, CHOI, Hundai, KIM, Sanghee, CHUNG, Haeyoung, SONG, Indal, CHOI, Young, JUNG, Dae-Hee, KIM, Byungchul, CHOI, Jung-Hwan, JANG, Seong-Jin, KIM, Chi-Wook, LEE, Jung-Bae, JOO SUN CHOI, SHIM, Yong, BAE, Wonil, KANG, Sanghee, LEE, Dongsu, JUNG, Hangyun, HYUN, Seokhun, JEOUNG, Hanki
Published in IEEE journal of solid-state circuits (01.01.2013)
Published in IEEE journal of solid-state circuits (01.01.2013)
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Conference Proceeding
A 1.2V 30nm 3.2Gb/s/pin 4Gb DDR4 SDRAM with dual-error detection and PVT-tolerant data-fetch scheme
Kyomin Sohn, Taesik Na, Indal Song, Yong Shim, Wonil Bae, Sanghee Kang, Dongsu Lee, Hangyun Jung, Hanki Jeoung, Ki-Won Lee, Junsuk Park, Jongeun Lee, Byunghyun Lee, Inwoo Jun, Juseop Park, Junghwan Park, Hundai Choi, Sanghee Kim, Haeyoung Chung, Young Choi, Dae-Hee Jung, Jang Seok Choi, Byungsick Moon, Jung-Hwan Choi, Byungchul Kim, Seong-Jin Jang, Joo Sun Choi, Kyung Seok Oh
Published in 2012 IEEE International Solid-State Circuits Conference (01.02.2012)
Published in 2012 IEEE International Solid-State Circuits Conference (01.02.2012)
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Conference Proceeding
Dual-loop 2-step ZQ calibration for dedicated power supply voltage in LPDDR4 SDRAM
Chang-Kyo Lee, Junha Lee, Ki-Ho Kim, Jin-Seok Heo, Gil-Hoon Cha, Jin-Hyeok Baek, Dae-Sik Moon, Yoon-Joo Eom, Tae-Sung Kim, Hyunyoon Cho, Younghoon Son, Seonghwan Kim, Jong-Wook Park, Sewon Eom, Si-Hyeong Cho, Young-Ryeol Choi, Seungseob Lee, Kyoung-Soo Ha, Youngseok Kim, Bo-Tak Lim, Dae-Hee Jung, Eungsung Seo, Kyoung-Ho Kim, Yoon-Gyu Song, Youn-Sik Park, Tae-Young Oh, Seung-Jun Bae, In-Dal Song, Seok-Hun Hyun, Joon-Young Park, Hyuck-Joon Kwon, Young-Soo Sohn, Jung-Hwan Choi, Kwang-Il Park, Seong-Jin Jang
Published in 2017 IEEE Asian Solid-State Circuits Conference (A-SSCC) (01.11.2017)
Published in 2017 IEEE Asian Solid-State Circuits Conference (A-SSCC) (01.11.2017)
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Conference Proceeding