TESTING DEVICE
GUNNARSSON DAVID, KUUKKALA ARI, JUNES AKI, HENTTONEN VESA, ROSCHIER LEIF, MANNINEN MATTI, SALMINEN TIMO
Year of Publication 12.11.2020
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Year of Publication 12.11.2020
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TESTING DEVICE
GUNNARSSON DAVID, KUUKKALA ARI, JUNES AKI, HENTTONEN VESA, ROSCHIER LEIF, MANNINEN MATTI, SALMINEN TIMO
Year of Publication 12.11.2020
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Year of Publication 12.11.2020
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Year of Publication 07.08.2024
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Year of Publication 07.08.2024
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CRYOGENIC WAFER PROBER WITH MOVABLE THERMAL RADIATION SHIELD
SALMINEN, Timo, JUNES, Aki, KUUKKALA, Ari, ROSCHIER, Leif, HENTTONEN, Vesa, GUNNARSSON, David, MANNINEN, Matti
Year of Publication 07.08.2024
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Year of Publication 07.08.2024
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SALMINEN, Timo, JUNES, Aki, KUUKKALA, Ari, ROSCHIER, Leif, HENTTONEN, Vesa, GUNNARSSON, David, MANNINEN, Matti
Year of Publication 03.04.2024
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Year of Publication 03.04.2024
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CRYOGENIC PROBE STATION WITH LOADING ASSEMBLY
SALMINEN, Timo, JUNES, Aki, KUUKKALA, Ari, ROSCHIER, Leif, HENTTONEN, Vesa, GUNNARSSON, David, MANNINEN, Matti
Year of Publication 03.04.2024
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Year of Publication 03.04.2024
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Testing device
Kuukkala, Ari, Manninen, Matti, Henttonen, Vesa, Gunnarsson, David, Roschier, Leif, Junes, Aki, Salminen, Timo
Year of Publication 18.01.2022
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Year of Publication 18.01.2022
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Testing device includes radiation shields for testing integrated circuits on a wafer
Kuukkala, Ari, Manninen, Matti, Henttonen, Vesa, Gunnarsson, David, Roschier, Leif, Junes, Aki, Salminen, Timo
Year of Publication 23.11.2021
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Year of Publication 23.11.2021
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TESTING DEVICE
Kuukkala, Ari, Manninen, Matti, Henttonen, Vesa, Gunnarsson, David, Roschier, Leif, Junes, Aki, Salminen, Timo
Year of Publication 05.11.2020
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Year of Publication 05.11.2020
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Testing Device
SALMINEN, Timo, JUNES, Aki, KUUKKALA, Ari, ROSCHIER, Leif, HENTTONEN, Vesa, GUNNARSSON, David, MANNINEN, Matti
Year of Publication 05.11.2020
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Year of Publication 05.11.2020
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CRYOGENIC PROBE STATION
SALMINEN, Timo, JUNES, Aki, KUUKKALA, Ari, ROSCHIER, Leif, HENTTONEN, Vesa, GUNNARSSON, David, MANNINEN, Matti
Year of Publication 04.11.2020
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Year of Publication 04.11.2020
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CRYOGENIC WAFER PROBER WITH MOVABLE THERMAL RADIATION SHIELD
SALMINEN, Timo, JUNES, Aki, KUUKKALA, Ari, ROSCHIER, Leif, HENTTONEN, Vesa, GUNNARSSON, David, MANNINEN, Matti
Year of Publication 04.11.2020
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Year of Publication 04.11.2020
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CRYOGENIC PROBE STATION WITH LOADING ASSEMBLY
SALMINEN, Timo, JUNES, Aki, KUUKKALA, Ari, ROSCHIER, Leif, HENTTONEN, Vesa, GUNNARSSON, David, MANNINEN, Matti
Year of Publication 04.11.2020
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Year of Publication 04.11.2020
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CRYOGENIC WAFER PROBER WITH MOVABLE THERMAL RADIATION SHIELD
SALMINEN, Timo, JUNES, Aki, KUUKKALA, Ari, ROSCHIER, Leif, HENTTONEN, Vesa, GUNNARSSON, David, MANNINEN, Matti
Year of Publication 04.11.2020
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Year of Publication 04.11.2020
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CRYOGENIC WAFER PROBER WITH CAMERA, WINDOW AND SHUTTER
SALMINEN, Timo, JUNES, Aki, KUUKKALA, Ari, ROSCHIER, Leif, HENTTONEN, Vesa, GUNNARSSON, David, MANNINEN, Matti
Year of Publication 04.11.2020
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Year of Publication 04.11.2020
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TESTING DEVICE
KUUKKALA, ARI, JUNES, AKI, SALMINEN, TIMO, HENTTONEN, VESA, MANNINEN, MATTI, ROSCHIER, LEIF, GUNNARSSON, DAVID
Year of Publication 03.11.2020
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Year of Publication 03.11.2020
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TESTING DEVICE FOR INTEGRATED CIRCUITS ON A WAFER
KUUKKALA, ARI, JUNES, AKI, SALMINEN, TIMO, HENTTONEN, VESA, MANNINEN, MATTI, ROSCHIER, LEIF, GUNNARSSON, DAVID
Year of Publication 03.11.2020
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Year of Publication 03.11.2020
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TESTING DEVICE
GUNNARSSON DAVID, KUUKKALA ARI, JUNES AKI, HENTTONEN VESA, ROSCHIER LEIF, MANNINEN MATTI, SALMINEN TIMO
Year of Publication 20.11.2020
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Year of Publication 20.11.2020
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TESTING DEVICE
GUNNARSSON DAVID, KUUKKALA ARI, JUNES AKI, HENTTONEN VESA, ROSCHIER LEIF, MANNINEN MATTI, SALMINEN TIMO
Year of Publication 20.11.2020
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Year of Publication 20.11.2020
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