Search Results - "JUN CHUNG SAM" :: K.UTB vyhledávací portál

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OVERLAY MEASURING METHOD AND SYSTEM, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME

by YUN SEONG-JIN, JUN CHUNG-SAM, LEE SANG-KIL, KO WOO-SEOK, YANG YU-SIN
Year of Publication 14.01.2016

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INSPECTION APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICES

by PARK IL-SEOK, JUN CHUNG-SAM, KIM JONG-MIN, LEE SU-YOUNG, SHIN KWANG-IL
Year of Publication 29.10.2021

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PROCESS MANAGEMENT SYSTEMS USING COMPARISON OF STATISTICAL DATA TO PROCESS PARAMETERS AND PROCESS MANAGEMENT DEVICES

by SOHN YOUNG HOON, LEE BAE JIN, JUN CHUNG SAM, LEE SANG KIL, YANG YU SIN
Year of Publication 03.09.2015

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Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film

by Yang Yu-Sin, Jun Chung-Sam, Ryu Kwan-Woo, Ko Woo-Seok, Kwak Ho-Jeong, Kim Souk, Lee Sang-Kil, Ryu Sung-Yoon
Year of Publication 16.08.2016

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APPARATUS FOR FORMING A THIN LAYER AND METHOD OF FORMING A THIN LAYER ON A SUBSTRATE USNIG THE SAME

by JUN CHUNG-SAM, LEE SANG-KIL, KIM BANG-WON, JANG YOO-SEOK, YANG YU-SIN, KIM MIN-KOOK, YOON YOUNG-JEE
Year of Publication 23.06.2016

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Method of inspecting a substrate using ultrasonic waves and apparatus for performing the same

by JUN CHUNG-SAM, KIM KWANG-SOO
Year of Publication 05.05.2009

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Method of inspecting a substrate using ultrasonic waves and apparatus for performing the same

by Kim, Kwang-Soo, Jun, Chung-Sam
Year of Publication 05.05.2009

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SCANNING ELECTRON MICROSCOPE SYSTEM CAPABLE OF MEASURING IN-CELL OVERLAY OFFSET USING HIGH-ENERGY ELECTRON BEAM AND METHOD THEREOF

by KO WOO SEOK, JUN CHUNG SAM, LEE SANG KIL, YANG YU SIN, KIM MIN KOOK
Year of Publication 30.04.2015

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A new method for fluxgate magnetometers using the coupling property of odd and even harmonics

by Kim, H C, Jun, Chung Sam
Published in Measurement science & technology (01.07.1995)

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Journal Article

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BROADBAND LIGHT SOURCE AND OPTICAL INSPECTOR HAVING THE SAME

by YUN SEONG-JIN, JUN CHUNG-SAM, LEE SANG-KIL, RYU SUNG-YOON, KO WOO-SEOK, YANG YU-SIN
Year of Publication 07.04.2016

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APPARATUS AND METHOD FOR INSPECTION OF SUBSTRATE DEFECT

by YUN SEONG-JIN, JUN CHUNG-SAM, SONG JOON-SEO, LEE SANG-KIL, SHIN JI-YOUNG, KO WOO-SEOK, YANG YU-SIN
Year of Publication 28.01.2016

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OPTICAL TRANSFORMATION MODULE AND OPTICAL MEASUREMENT SYSTEM, AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING OPTICAL TRANSFORMATION MODULE AND OPTICAL MEASUREMENT SYSTEM

by JUN CHUNG-SAM, KIM TAE-JOONG, LEE SANG-KIL, KIM KWANG-SOO, YANG YU-SIN, JEONG YONG-DEOK, JEON BYEONG-HWAN
Year of Publication 21.01.2016

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Patent

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SEMICONDUCTOR CHIPS INSPECTION APPARATUS

by SOHN YOUNG HOON, RYU SUNG YOON, JUN CHUNG SAM, LEE SEONG SIL
Year of Publication 23.04.2019

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Method and apparatus to measure step height of device using scanning electron microscope

by JUN CHUNG-SAM, LEE SANG-KIL, SOHN YOUNG-HOON, LEE JIN-WOO, YANG YU-SIN, JEONG YONG-DEOK
Year of Publication 24.06.2014

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Light focusing unit and spectrum measuring apparatus having the same

by JUN CHUNG-SAM, PARK HWAN-SHIK, KIM HYUN-JONG
Year of Publication 04.11.2010

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SCANNING PROBE INSPECTOR

by JEE YUN-JUNG, JUN CHUNG-SAM, RYU SUNG-YOON, OH DUCK-MAHN, SOHN YOUNG-HOON
Year of Publication 14.06.2019

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APPARATUS OF INSPECTING RESISTIVE DEFECTS OF SEMICONDUCTOR DEVICES AND INSPECTING METHOD USING THE SAME

by JUN CHUNG-SAM, PARK MI-RA, LEE SANG-KIL, SUNG DAE-JIN, LEE NA-KYOUNG, YANG YU-SIN, JEONG YONG-DEOK
Year of Publication 24.03.2016

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Characterization of Residual Implant Damage by Generation time and Surface Photovoltage Techniques

by Jee, Yun-Jung, Kim, Chu-Yong, Jun, Chung-Sam, Kim, Tae-Sung, Belyaev, Anton, Marinskiy, Dmitriy
Published in Meeting abstracts (Electrochemical Society) (29.08.2008)

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Journal Article

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APPARATUS FOR MEASURING THICKNESS OF THIN FILM, SYSTEM INCLUDING THE APPARATUS, AND METHOD FOR MEASURING THICKNESS OF THIN FILM

by KIM SOUK, JUN CHUNG-SAM, LEE SANG-KIL, RYU SUNG-YOON, KO WOO-SEOK, YANG YU-SIN, KWAK HO-JEONG, RYU KWAN-WOO
Year of Publication 03.03.2016

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Apparatus and method for inspecting multi-layer structure method for fabricating semiconductor device comprising the method

by JUN CHUNG-SAM, KIM JUNG-WON, RYU SUNG-YOON, YANG YU-SIN, KWAK HYUN-SU
Year of Publication 17.05.2019

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