method and apparatus for analyzing a sample using fast Fourier transformation
JUN, CHUNG SAM, JUN, SANG MUN, PARK, DONG JIN, CHOI, SEON YONG, CHOI, JEONG HYEON
Year of Publication 10.05.2004
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Year of Publication 10.05.2004
Patent
METHOD OF MANUFACTURING STANDARD SAMPLE OF SEMICONDUCTOR DEVICE
JUN, CHUNG SAM, JUN, SANG MUN, PARK, JONG CHEOL, CHOI, SEON YONG, PARK, HWAN SIK
Year of Publication 29.04.2004
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Year of Publication 29.04.2004
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Method for measuring thickness of thin layer
JUN, CHUNG SAM, JUN, SANG MUN, HYUN, PIL SIK, CHOI, SANG BONG, CHO, HYEONG SEOK
Year of Publication 20.11.2003
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Year of Publication 20.11.2003
Patent
Method of measuring depth of contact hole
JUN, CHUNG SAM, JUN, SANG MUN, PARK, DONG JIN, KIM, JEONG SU, CHOI, SEON YONG
Year of Publication 08.05.2004
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Year of Publication 08.05.2004
Patent
METHOD FOR MEASURING THICKNESS OF THIN FILM AND APPARATUS FOR THE SAME
JUN, CHUNG SAM, JUN, SANG MUN, HYUN, PIL SIK, CHOI, SANG BONG, CHO, HYEONG SEOK
Year of Publication 07.05.2001
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Year of Publication 07.05.2001
Patent
METHOD FOR MEASURING ETCHING STATE OF SEMICONDUCTOR WAFER
JUN, CHUNG SAM, JUN, SANG MUN, KANG, MIN SEOP, CHOI, SANG BONG, CHO, HYEONG SEOK
Year of Publication 16.04.2001
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Year of Publication 16.04.2001
Patent
APPARATUS AND METHOD FOR ETCHING POLYSILICON LAYER
JUN, SANG MUN, CHOI, BAEK SUN, KIM, JIN SEONG, KWAK, GYU HWAN, LEE, HWI GEON
Year of Publication 01.02.2001
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Year of Publication 01.02.2001
Patent
Method for measurement of wafer contamination and apparatus for the same
JUN, CHUNG SAM, JUN, SANG MUN, KIM, BAK SONG, EOM, TAE MIN, RYU, GWAN U, YANG, YU SIN, CHOI, SEON YONG
Year of Publication 05.06.2004
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Year of Publication 05.06.2004
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METHOD AND APPARATUS FOR DETECTING CONTAMINATION IN AN ION-IMPLANTED WAFER
JUN, CHUNG SAM, JUN, SANG MUN, KIM, BAK SONG, EOM, TAE MIN, RYU, GWAN U, YANG, YU SIN, CHOI, SEON YONG
Year of Publication 05.06.2004
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Year of Publication 05.06.2004
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Thinner composition and method for stripping a photoresist using the same
JUN, SANG MUN, CHOI, BAEK SUN, JANG, OK SEOK, BAE, EUN MI, JUNG, HOE SIK, AHN, SEUNG HYEON, LIM, YEONG CHEOL
Year of Publication 28.04.2004
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Year of Publication 28.04.2004
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Cleaning Solution and Method of Cleaning Ceramic Part
JUN, SANG MUN, KIM, JEONG JU, PARK, DONG JIN, KIM, DAE HUN, RYU, JAE JUN, JUN, PIL GWON, KIM, JIN SEONG
Year of Publication 03.01.2004
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Year of Publication 03.01.2004
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Thinner composition and method for stripping a photoresist using the same
JUN, SANG MUN, CHOI, BAEK SUN, JANG, OK SEOK, BAE, EUN MI, JUNG, HOE SIK, AHN, SEUNG HYEON, JUN, MI SUK
Year of Publication 25.06.2003
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Year of Publication 25.06.2003
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