Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluation
SU KUANNG, HSIEH YUAN-YU, KUO SUNG-NIEN, KO WEN-HSIUNG, LEE JIH-SAN, JUAN KUEII
Year of Publication 09.10.2012
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Year of Publication 09.10.2012
Patent
Alternating Current (AC) Stress Test Circuit, Method for Evaluating AC Stress Induced Hot Carrier Injection (HCI) Degradation, and Test Structure for HCI Degradation Evaluation
SU KUANNG, HSIEH YUAN-YU, KUO SUNG-NIEN, KO WEN-HSIUNG, LEE JIH-SAN, JUAN KUEII
Year of Publication 11.08.2011
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Year of Publication 11.08.2011
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Fabrication method for a shallow trench isolation structure
HUANG YU-SHYANG, CHENG SHUI-MING, LIU CHIHIEN, CHENG YAOIN, JUAN KUEII
Year of Publication 05.12.2002
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Year of Publication 05.12.2002
Patent