An enhanced fully scaled 1.2-μm CMOS process for analog
Reich, R.K., Rahn, C.H., Holt, M.S., Schrankler, J.W., Ju, D.-H., Kirchner, G.D.
Published in IEEE journal of solid-state circuits (01.04.1986)
Published in IEEE journal of solid-state circuits (01.04.1986)
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Journal Article
An enhanced fully scaled 1.2-mum CMOS process for analog
Rahn, C H, Holt, M S, Schrankler, J W, Ju, D-H, Kirchner, G D
Published in IEEE journal of solid-state circuits (01.04.1986)
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Published in IEEE journal of solid-state circuits (01.04.1986)
Journal Article
An enhanced fully scaled 1.2-μm CMOS process for analog applications
REICH, R. K, RAHN, C. H, HOLT, M. S, SCHRANKLER, J. W, JU, D.-H, KIRCHNER, G. D
Published in IEEE journal of solid-state circuits (01.04.1986)
Published in IEEE journal of solid-state circuits (01.04.1986)
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Journal Article
Transient substrate current generation and device degradation in CMOS circuits at 77K
Ju, D.-H., Reich, R.K., Schrankler, J.W., Holt, M.S., Kirchner, G.D.
Published in 1985 International Electron Devices Meeting (1985)
Published in 1985 International Electron Devices Meeting (1985)
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Conference Proceeding
Comments on "Experimental and theoretical comparison of some algorithms for beamforming in single receiver adaptive arrays" [with reply]
Yimin Zhao, Dehang Ju, Wahlberg, B.G., Mareels, I.M.Y., Webster, I.
Published in IEEE transactions on antennas and propagation (01.11.1995)
Published in IEEE transactions on antennas and propagation (01.11.1995)
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Journal Article
Physical analysis for saturation behavior of hot-carrier degradation in lightly doped drain N-channel metal-oxide-semiconductor field effect transistors
JUNG-SUK GOO, HYUNGSOON SHIN, HYUNSANG HWANG, DAE-GWAN KANG, DONG-HYUK JU
Published in Japanese Journal of Applied Physics (1994)
Published in Japanese Journal of Applied Physics (1994)
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Conference Proceeding
Journal Article
Electron-velocity saturation at a BJT collector junction under low-level conditions
Warner, R.M., Dong-Hyuk Ju, Grung, B.L.
Published in IEEE transactions on electron devices (01.03.1983)
Published in IEEE transactions on electron devices (01.03.1983)
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Journal Article