Fabrication and Device Characterization of Omega-Shaped-Gate ZnO Nanowire Field-Effect Transistors
Keem, Kihyun, Jeong, Dong-Young, Kim, Sangsig, Lee, Moon-Sook, Yeo, In-Seok, Chung, U-In, Moon, Joo-Tae
Published in Nano letters (01.07.2006)
Published in Nano letters (01.07.2006)
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Journal Article
A stacked memory device on logic 3D technology for ultra-high-density data storage
Kim, Jiyoung, Hong, Augustin J, Kim, Sung Min, Shin, Kyeong-Sik, Song, Emil B, Hwang, Yongha, Xiu, Faxian, Galatsis, Kosmas, Chui, Chi On, Candler, Rob N, Choi, Siyoung, Moon, Joo-Tae, Wang, Kang L
Published in Nanotechnology (24.06.2011)
Published in Nanotechnology (24.06.2011)
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Journal Article
Experimental investigation of the impact of LWR on sub-100-nm device performance
Hyun-Woo Kim, Ji-Young Lee, Shin, J., Sang-Gyun Woo, Han-Ku Cho, Joo-Tae Moon
Published in IEEE transactions on electron devices (01.12.2004)
Published in IEEE transactions on electron devices (01.12.2004)
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Journal Article
Synchronous Pulse Plasma Operation upon Source and Bias Radio Frequencys for Inductively Coupled Plasma for Highly Reliable Gate Etching Technology
Tokashiki, Ken, Cho, Hong, Banna, Samer, Lee, Jeong-Yun, Shin, Kyoungsub, Todorow, Valentin, Kim, Woo-Seok, Bai, KeunHee, Joo, Sukho, Choe, Jeong-Dong, Ramaswamy, Kartik, Agarwal, Ankur, Rauf, Shahid, Collins, Ken, Choi, SangJun, Cho, Han, Kim, Hyun Joong, Lee, Changhun, Lymberopoulos, Dimitris, Yoon, Junho, Han, Woosung, Moon, Joo-Tae
Published in Japanese Journal of Applied Physics (01.08.2009)
Published in Japanese Journal of Applied Physics (01.08.2009)
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Journal Article
Etching characteristics and modeling for oval-shaped contact
Park, Sung-Chan, Lim, Seok-Hyun, Shin, Chul-Ho, Min, Gyung-Jin, Kang, Chang-Jin, Cho, Han-Ku, Moon, Joo-Tae
Published in Thin solid films (23.04.2007)
Published in Thin solid films (23.04.2007)
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Journal Article
Conference Proceeding
Spatial Distribution of Interface Traps in Sub-50-nm Recess-Channel-Type DRAM Cell Transistors
CHUNG, Eun-Ae, KIM, Young-Pil, MOON, Joo-Tae, KIM, Sangsig, PARK, Min-Chul, NAM, Kab-Jin, LEE, Sung-Sam, MIN, Ji-Young, YANG, Giyoung, SHIN, Yu-Gyun, CHOI, Siyoung, JIN, Gyoyoung
Published in IEEE electron device letters (01.01.2011)
Published in IEEE electron device letters (01.01.2011)
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Journal Article
Leakage Current Reduction Mechanism of Oxide--Nitride--Oxide Inter-Poly Dielectrics through the Post Plasma Oxidation Treatment
Lee, Woong, Jee, Jeonggeun, Yoo, Dae-Han, Lee, Eun-Young, Bok, Jinkwon, Hyung, Younwoo, Kim, Seoksik, Kang, Chang-Jin, Moon, Joo-Tae, Roh, Yonghan
Published in Japanese Journal of Applied Physics (01.04.2011)
Published in Japanese Journal of Applied Physics (01.04.2011)
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Journal Article
Low-Temperature Solid Phase Epitaxial Regrowth of Silicon for Stacked Static Random Memory Application
Lee, Kong-Soo, Yeo, Chadong, Yoo, Dae-Han, Kim, Seok-Sik, Moon, Joo-Tae, Jung, Soon-Moon, Son, Yong-Hoon, Park, Hyunho, Jeong, Hanwook, Kim, Kwang-Ryul, Choi, Byoungdeog
Published in Japanese Journal of Applied Physics (01.01.2011)
Published in Japanese Journal of Applied Physics (01.01.2011)
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Journal Article
Characterization of threshold voltage instability after program in charge trap flash memory
Bio Kim, SeungJae Baik, Sunjung Kim, Joon-Gon Lee, Bonyoung Koo, Siyoung Choi, Joo-Tae Moon
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Effect of pre-existing void in sub-30nm Cu interconnect reliability
Zungsun Choi, Tsukasa, M, Jong Myeong Lee, Gil-Heyun Choi, Siyoung Choi, Joo-Tae Moon
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
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Conference Proceeding
Gate oxide effect on wafer level reliability of next generation dram transistors
Yu Gyun Shin, Kab-Jin Nam, Heedon Hwang, Jeong Hee Han, Sangjin Hyun, Siyoung Choi, Joo-Tae Moon
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
Novel Vertical-Stacked-Array-Transistor (VSAT) for ultra-high-density and cost-effective NAND Flash memory devices and SSD (Solid State Drive)
Jiyoung Kim, Hong, A.J., Sung Min Kim, Song, E.B., Jeung Hun Park, Jeonghee Han, Siyoung Choi, Deahyun Jang, Joo -Tae Moon, Wang, K.L.
Published in 2009 Symposium on VLSI Technology (01.06.2009)
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Published in 2009 Symposium on VLSI Technology (01.06.2009)
Conference Proceeding
Electromigration tests for critical stress and failure mechanism evaluation in Cu/W via/Al hybrid interconnect
Zungsun Choi, Byung-Lyul Park, Jong Myeong Lee, Gil-Heyun Choi, Hyeon-Deok Lee, Joo-Tae Moon
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Electrical field dependence of data retention in high-k interpoly dielectrics
Chun-Hyung Chung, Seung-Hyun Lim, Sang-Wook Lim, Young-Sun Kim, Choi, S.Y., Joo-Tae Moon
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Most Efficient Alternative Manner of Patterning sub-80 nm Contact Holes and Trenches with 193 nm Lithography
Hah, Jung Hwan, Yoon, Jin-Young, Hata, Mitsuhiro, Kim, Sang Wook, Kim, Hyun-Woo, Woo, Sang-Gyoun, Cho, Han-Ku, Han, Woo-Sung, Moon, Joo-Tae, Ryu, Byoung-Il
Published in Japanese Journal of Applied Physics (01.06.2004)
Published in Japanese Journal of Applied Physics (01.06.2004)
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Journal Article
State of the art technologies and future prospective in display industry
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Conference Proceeding
Investigation of Chemical Vapor Deposition (CVD)-Derived Cobalt Silicidation for the Improvement of Contact Resistance
Kim, Hyun-Su, Yun, Jong-Ho, Moon, Kwang-Jin, Sohn, Woong-Hee, Jung, Sug-Woo, Jung, Eun-Ji, Kim, Se-Hoon, Bae, Nam-Jin, Choi, Gil-Heyun, Kim, Sung-Tae, Chung, U-In, Moon, Joo-Tae, Ryu, Byung-Il
Published in Japanese Journal of Applied Physics (01.06.2005)
Published in Japanese Journal of Applied Physics (01.06.2005)
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Journal Article
Improved Cell Performance for sub-50 nm DRAM with Manufacturable Bulk FinFET Structure
Deok-Hyung Lee, Sun-Ghil Lee, Jong Ryeol Yoo, Gyoung-Ho Buh, Guk Hyon Yon, Dong-Woon Shin, Dong Kyu Lee, Hyun-Sook Byun, In Soo Jung, Tai-su Park, Yu Gyun Shin, Siyoung Choi, U-In Chung, Joo-Tae Moon, Byung-Il Ryu
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
Performance of DRAM Cell Transistor with Thermal Desorption Silicon Etching (TDSE) and Selective Si Channel Epi Techniques
Kim, Chul-Sung, Ku, Ja-Hum, Lee, Byeong-Chan, Yoo, Jong-Ryeol, Lee, Deok-Hyung, Choi, Siyoung, Chung, U-In, Moon, Joo-Tae
Published in Japanese Journal of Applied Physics (2003)
Published in Japanese Journal of Applied Physics (2003)
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Journal Article
Leakage current mechanisms in sub-50 nm recess-channel-type DRAM cell transistors with three-terminal gate-controlled diodes
CHUNG, Eun-Ae, KIM, Young-Pil, NAM, Kab-Jin, LEE, Sungsam, MIN, Ji-Young, SHIN, Yu-Gyun, CHOI, Siyoung, JIN, Gyoyoung, MOON, Joo-Tae, KIM, Sangsig
Published in Solid-state electronics (01.02.2011)
Published in Solid-state electronics (01.02.2011)
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Journal Article