On the Electrostatic Discharge Robustness of Graphene
Hong Li, Russ, Christian C., Wei Liu, Johnsson, David, Gossner, Harald, Banerjee, Kaustav
Published in IEEE transactions on electron devices (01.06.2014)
Published in IEEE transactions on electron devices (01.06.2014)
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Journal Article
Avalanche Breakdown Delay in ESD Protection Diodes
Johnsson, David, Pogany, Dionyz, Willemen, Joost, Gornik, Erich, Stecher, Matthias
Published in IEEE transactions on electron devices (01.10.2010)
Published in IEEE transactions on electron devices (01.10.2010)
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Journal Article
HMM–TLP correlation for system-efficient ESD design
Notermans, Guido, Bychikhin, Sergey, Pogany, Dionyz, Johnsson, David, Maksimovic, Dejan
Published in Microelectronics and reliability (01.06.2012)
Published in Microelectronics and reliability (01.06.2012)
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Journal Article
HMMaTLP correlation for system-efficient ESD design
Notermans, Guido, Bychikhin, Sergey, Pogany, Dionyz, Johnsson, David, Maksimovic, Dejan
Published in Microelectronics and reliability (01.06.2012)
Published in Microelectronics and reliability (01.06.2012)
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Journal Article
Discharge Waveforms of Emulated Die-to-Die ESD Discharges
Johnsson, David, Tamminen, Pasi, Viheriakoski, Toni, Gossner, Harald
Published in 2023 45th Annual EOS/ESD Symposium (EOS/ESD) (02.10.2023)
Published in 2023 45th Annual EOS/ESD Symposium (EOS/ESD) (02.10.2023)
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Conference Proceeding
Device Failure from the Initial Current Step of a CDM Discharge
Johnsson, David, Domanski, Krzysztof, Gossner, Harald
Published in 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2018)
Published in 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2018)
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Conference Proceeding
Device Failure from the Initial Current Step of a CDM Discharge
Johnsson, David, Domanski, Krzysztof, Gossner, Harald
Published in 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2018)
Published in 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2018)
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Conference Proceeding
Second breakdown behavior in bipolar ESD protection devices during low current long duration stress and its relation to moving current-tubes
Johnsson, D., Mamanee, W., Bychikhin, S., Pogany, D., Gornik, E., Stecher, M.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
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Conference Proceeding
A passive coupling circuit for injecting TLP-like stress pulses into only one end of a driver/receiver system
Orr, Benjamin, Johnsson, David, Domanski, Krzysztof, Gossner, Harald, Pommerenke, David
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
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Conference Proceeding
Directional pulse injection into a microelectronic system for electrostatic test
Orr, Benjamin J, Gossner, Harald, Domanski, Krzysztof, Johnsson, David
Year of Publication 25.09.2018
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Year of Publication 25.09.2018
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