METHOD FOR DETERMINING A SPRING CONSTANT FOR A DEFORMABLE SCANNING PROBE MICROSCOPE ELEMENT, AND SCANNING PROBE MICROSCOPE AND CALIBRATION DEVICE ARRANGED FOR DETERMINING A SPRING CONSTANT FOR A PROBE ELEMENT
BOSSCHE, ADRIANUS, YANG, CHUNG-KAI, SADEGHIAN, HAMED, KEULEN, ALFRED, FRENCH, PATRICK JAMES, GOOSEN, JOHANNES FRANS LODEWIJK
Year of Publication 15.05.2012
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Year of Publication 15.05.2012
Patent
METHOD FOR DETERMINING A SPRING CONSTANT FOR A DEFORMABLE SCANNING PROBE MICROSCOPE ELEMENT, AND SCANNING PROBE MICROSCOPE AND CALIBRATION DEVICE ARRANGED FOR DETERMINING A SPRING CONSTANT FOR A PROBE ELEMENT
VAN KEULEN, ALFRED, BOSSCHE, ADRIANUS, FRENCH, PATRICK, JAMES, YANG, CHUNG-KAI, SADEGHIAN, HAMED, GOOSEN, JOHANNES, FRANS, LODEWIJK
Year of Publication 18.05.2012
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Year of Publication 18.05.2012
Patent