Rewritable Switching of One Diode-One Resistor Nonvolatile Organic Memory Devices
Cho, Byungjin, Kim, Tae-Wook, Song, Sunghoon, Ji, Yongsung, Jo, Minseok, Hwang, Hyunsang, Jung, Gun-Young, Lee, Takhee
Published in Advanced materials (Weinheim) (19.03.2010)
Published in Advanced materials (Weinheim) (19.03.2010)
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Journal Article
Domain Knowledge-Based Neural Network Architecture for End-to-End Multiuser Precoding in Massive MIMO System
Jo, Minseok, Lee, Sangrim, Kim, Bonghoe, Lee, Kyungho, Jung, Ikjoo
Published in 2023 IEEE 97th Vehicular Technology Conference (VTC2023-Spring) (01.06.2023)
Published in 2023 IEEE 97th Vehicular Technology Conference (VTC2023-Spring) (01.06.2023)
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Conference Proceeding
Analog memory and spike-timing-dependent plasticity characteristics of a nanoscale titanium oxide bilayer resistive switching device
Seo, Kyungah, Kim, Insung, Jung, Seungjae, Jo, Minseok, Park, Sangsu, Park, Jubong, Shin, Jungho, Biju, Kuyyadi P, Kong, Jaemin, Lee, Kwanghee, Lee, Byounghun, Hwang, Hyunsang
Published in Nanotechnology (24.06.2011)
Published in Nanotechnology (24.06.2011)
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Journal Article
Investigation of State Stability of Low-Resistance State in Resistive Memory
Jubong Park, Minseok Jo, Bourim, El Mostafa, Jaesik Yoon, Dong-Jun Seong, Joonmyoung Lee, Wootae Lee, Hyunsang Hwang
Published in IEEE electron device letters (01.05.2010)
Published in IEEE electron device letters (01.05.2010)
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Journal Article
Nonvolatile Memory Functionality of ZnO Nanowire Transistors Controlled by Mobile Protons
Yoon, Jongwon, Hong, Woong-Ki, Jo, Minseok, Jo, Gunho, Choe, Minhyeok, Park, Woojin, Sohn, Jung Inn, Nedic, Stanko, Hwang, Hyungsang, Welland, Mark E, Lee, Takhee
Published in ACS nano (25.01.2011)
Published in ACS nano (25.01.2011)
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Journal Article
Improved Switching Uniformity and Speed in Filament-Type RRAM Using Lightning Rod Effect
PARK, Jubong, JO, Minseok, LEE, Joonmyoung, JUNG, Seungjae, KIM, Seonghyun, LEE, Wootae, SHIN, Jungho, HWANG, Hyunsang
Published in IEEE electron device letters (01.01.2011)
Published in IEEE electron device letters (01.01.2011)
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Journal Article
Development of a Semiempirical Compact Model for DC/AC Cell Operation of HfOx-Based ReRAMs
JINWOO NOH, MINSEOK JO, CHANG YONG KANG, GILMER, David, KIRSCH, Paul, LEE, Jack C, BYOUNG HUN LEE
Published in IEEE electron device letters (01.09.2013)
Published in IEEE electron device letters (01.09.2013)
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Journal Article
Materials and process aspect of cross-point RRAM (invited)
Lee, Joonmyoung, Jo, Minseok, Seong, Dong-jun, Shin, Jungho, Hwang, Hyunsang
Published in Microelectronic engineering (01.07.2011)
Published in Microelectronic engineering (01.07.2011)
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Journal Article
Conference Proceeding
Development of a Semiempirical Compact Model for DC/AC Cell Operation of }-Based ReRAMs
Jinwoo Noh, Minseok Jo, Chang Yong Kang, Gilmer, David, Kirsch, Paul, Lee, Jack C., Byoung Hun Lee
Published in IEEE electron device letters (01.09.2013)
Published in IEEE electron device letters (01.09.2013)
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Journal Article
New Set/Reset Scheme for Excellent Uniformity in Bipolar Resistive Memory
PARK, Jubong, JO, Minseok, JUNG, Seungjae, LEE, Joonmyoung, LEE, Wootae, KIM, Seonghyun, PARK, Sangsu, SHIN, Jungho, HWANG, Hyunsang
Published in IEEE electron device letters (01.03.2011)
Published in IEEE electron device letters (01.03.2011)
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Journal Article
Improved switching uniformity of a carbon-based conductive-bridge type ReRAM by controlling the size of conducting filament
Park, Jubong, Jo, Minseok, Lee, Joonmyoung, Jung, Seungjae, Lee, Wootae, Kim, Seonghyun, Park, Sangsu, Shin, Jungho, Hwang, Hyunsang
Published in Microelectronic engineering (01.06.2011)
Published in Microelectronic engineering (01.06.2011)
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Journal Article
New Insight Into PBTI Evaluation Method for nMOSFETs With Stacked High- k/IL Gate Dielectric
Sang Kyung Lee, Minseok Jo, Chang-Woo Sohn, Chang Yong Kang, Lee, J. C., Yoon-Ha Jeong, Byoung Hun Lee
Published in IEEE electron device letters (01.11.2012)
Published in IEEE electron device letters (01.11.2012)
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Journal Article
Noise-Analysis-Based Model of Filamentary Switching ReRAM With \hbox/\hbox Stacks
Daeseok Lee, Joonmyoung Lee, Minseok Jo, Jubong Park, Siddik, M., Hyunsang Hwang
Published in IEEE electron device letters (01.07.2011)
Published in IEEE electron device letters (01.07.2011)
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Journal Article
Effect of Fast Components in Threshold-Voltage Shift on Bias Temperature Instability in High- k MOSFETs
Minseok Jo, Seonghyun Kim, Seungjae Jung, Ju-Bong Park, Joonmyoung Lee, Hyung-Suk Jung, Choi, R., Hyunsang Hwang
Published in IEEE electron device letters (01.04.2010)
Published in IEEE electron device letters (01.04.2010)
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Journal Article
Estimation of Interfacial Fixed Charge at Al2O3/SiO2 Using Slant-Etched Wafer for Solar Cell Application
Ahn, Youngkyoung, Choudhury, Sakeb Hasan, Lee, Daeseok, Sadaf, Sharif Md, Siddik, Manzar, Jo, Minseok, Park, Sungeun, Kim, Young Do, Kim, Dong Hwan, Hwang, Hyunsang
Published in Jpn J Appl Phys (01.07.2011)
Published in Jpn J Appl Phys (01.07.2011)
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Journal Article
Device Performance and Reliability Characteristics of Tantalum–Silicon–Nitride Electrode/Hafnium Oxide n-Type Metal–Oxide–Semiconductor Field-Effect Transistor Depending on Electrode Composition
Park, Hokyung, Chang, Man, Jo, Minseok, Choi, Rino, Lee, Byoung Hun, Hwang, Hyunsang
Published in Japanese Journal of Applied Physics (01.11.2009)
Published in Japanese Journal of Applied Physics (01.11.2009)
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Journal Article
Oxygen vacancy induced charge trapping and positive bias temperature instability in HfO2nMOSFET
Jo, Minseok, Park, Hokyung, Chang, Man, Jung, Hyung-Suk, Lee, Jong-Ho, Hwang, Hyunsang
Published in Microelectronic engineering (01.09.2007)
Published in Microelectronic engineering (01.09.2007)
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Journal Article
Novel cross-point resistive switching memory with self-formed schottky barrier
Minseok Jo, Dong-jun Seong, Seonghyun Kim, Joonmyoung Lee, Wootae Lee, Ju-Bong Park, Sangsoo Park, Seungjae Jung, Jungho Shin, Daeseok Lee, Hyunsang Hwang
Published in 2010 Symposium on VLSI Technology (01.06.2010)
Published in 2010 Symposium on VLSI Technology (01.06.2010)
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Conference Proceeding