by He, Linfeng, Salcedo, Javier A., Parthasarathy, Srivatsan, Zhou, Yuanzhong, Hajjar, Jean-Jacques, Sundaram, Kalpathy
Published in IEEE electron device letters (01.12.2018)

by Qiang Cui, Salcedo, J. A., Parthasarathy, S., Yuanzhong Zhou, Liou, J. J., Hajjar, J. J.
Published in IEEE electron device letters (01.02.2013)

by Malobabic, S, Salcedo, J A, Hajjar, J, Liou, J J
Published in IEEE transactions on electron devices (01.10.2010)

by He, Linfeng, Salcedo, Javier A., Hajjar, Jean-Jacques, Sundaram, Kalpathy
Published in IEEE transactions on electron devices (01.04.2020)

by He, Linfeng, Salcedo, Javier A., Parthasarathy, Srivatsan, Hajjar, Jean-Jacques, Sundaram, Kalpathy
Published in IEEE transactions on electron devices (01.08.2020)

by Meng Miao, Yuanzhong Zhou, Salcedo, Javier A., Hajjar, Jean-Jacques, Liou, Juin J.
Published in IEEE electron device letters (01.11.2016)

by Yuanzhong Zhou, Meng Miao, Salcedo, Javier A., Hajjar, Jean-Jacques, Liou, Juin J.
Published in IEEE transactions on electron devices (01.12.2015)

by Sirui Luo, Salcedo, Javier A., Hajjar, Jean-Jacques, Yuanzhong Zhou, Liou, Juin J.
Published in IEEE electron device letters (01.04.2014)

by Miao, Meng, Zhou, Yuanzhong, Salcedo, Javier A., Hajjar, Jean-Jacques, Liou, Juin J.
Published in Microelectronics and reliability (01.01.2015)

by Salcedo, J. A., Hajjar, J-J, Malobabic, S., Liou, J. J.
Published in IEEE electron device letters (01.06.2012)

by Qiang Cui, Parthasarathy, Srivatsan, Salcedo, Javier A, Liou, Juin J, Hajjar, Jean J, Yuanzhong Zhou
Published in IEEE electron device letters (01.05.2010)

by Malobabic, S., Salcedo, J. A., Hajjar, Jean-Jacques, Liou, J. J.
Published in IEEE electron device letters (01.11.2012)

by Ellis, D F, Yuanzhong Zhou, Salcedo, J A, Hajjar, J, Liou, J J
Published in IEEE transactions on electron devices (01.09.2010)

by Malobabic, S., Salcedo, J. A., Righter, A. W., Hajjar, J., Liou, J. J.
Published in IEEE electron device letters (01.09.2011)

by Salcedo, Javier A., Liou, Juin J., Liu, Zhiwei, Vinson, James E.
Published in IEEE transactions on electron devices (01.04.2007)

by Cui, Qiang, Parthasarathy, Srivatsan, Salcedo, Javier A., Liou, Juin J., Hajjar, Jean J., (Paul) Zhou, Yuanzhong
Published in Microelectronics and reliability (01.01.2014)

by Salcedo, J.A., Liou, J.J., Bernier, J.C.
Published in IEEE transactions on electron devices (01.12.2005)

by Salcedo, J.A., Liou, J.J.
Published in IEEE electron device letters (01.01.2006)

by Salcedo, Javier A., Liou, Juin J., Afridi, Muhammad Y., Hefner, Allen R.
Published in Microelectronics and reliability (01.08.2006)

by Salcedo, J.A., Liou, J.J., Bernier, J.C.
Published in IEEE electron device letters (01.09.2004)