A Highly Responsive Silicon Nanowire/Amplifier MOSFET Hybrid Biosensor
Lee, Jieun, Jang, Jaeman, Choi, Bongsik, Yoon, Jinsu, Kim, Jee-Yeon, Choi, Yang-Kyu, Myong Kim, Dong, Hwan Kim, Dae, Choi, Sung-Jin
Published in Scientific reports (21.07.2015)
Published in Scientific reports (21.07.2015)
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Journal Article
Influence of Alkyl Side Chain on the Crystallinity and Trap Density of States in Thiophene and Thiazole Semiconducting Copolymer Based Inkjet-Printed Field-Effect Transistors
Lee, Jiyoul, Chung, Jong Won, Jang, Jaeman, Kim, Do Hwan, Park, Jeong-Il, Lee, Eunkyung, Lee, Bang-Lin, Kim, Joo-Young, Jung, Ji Young, Park, Joon Seok, Koo, Bonwon, Jin, Yong Wan, Kim, Dae Hwan
Published in Chemistry of materials (14.05.2013)
Published in Chemistry of materials (14.05.2013)
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Journal Article
Extraction of Propagation Delay-Correlated Mobility and Its Verification for Amorphous InGaZnO Thin-Film Transistor-Based Inverters
Lee, Kyung Min, Jang, Jaeman, Choi, Sung-Jin, Kim, Dong Myong, Kim, Kyung Rok, Kim, Dae Hwan
Published in IEEE transactions on electron devices (01.05.2015)
Published in IEEE transactions on electron devices (01.05.2015)
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Journal Article
Endurance Characteristics of Amorphous-InGaZnO Transparent Flash Memory With Gold Nanocrystal Storage Layer
Jaeman Jang, Jae Chul Park, Dongsik Kong, Kim, D. M., Jang-Sik Lee, Byeong-Hyeok Sohn, Il Hwan Cho, Dae Hwan Kim
Published in IEEE transactions on electron devices (01.11.2011)
Published in IEEE transactions on electron devices (01.11.2011)
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Journal Article
Fully Transfer Characteristic-Based Technique for Surface Potential and Subgap Density of States in p-Channel Polymer-Based TFTs
Lee, Jaewook, Jun, Sungwoo, Jang, Jaeman, Bae, Hagyoul, Kim, Hyeongjung, Chung, Jong Won, Choi, Sung-Jin, Kim, Dae Hwan, Lee, Jiyoul, Kim, Dong Myong
Published in IEEE electron device letters (01.12.2013)
Published in IEEE electron device letters (01.12.2013)
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Journal Article
Extraction of Separated Source and Drain Resistances in Amorphous Indium-Gallium-Zinc Oxide TFTs Through C- V Characterization
BAE, Hagyoul, KIM, Sungchul, BAE, Minkyung, JA SUN SHIN, KONG, Dongsik, JUNG, Hyunkwang, JANG, Jaeman, LEE, Jieun, DAE HWAN KIM, DONG MYONG KIM
Published in IEEE electron device letters (01.06.2011)
Published in IEEE electron device letters (01.06.2011)
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Journal Article
Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors
Lee, Jaewook, Jang, Jaeman, Kim, Hyeongjung, Lee, Jiyoul, Lee, Bang-Lin, Choi, Sung-Jin, Kim, Dong Myong, Kim, Dae Hwan, Kim, Kyung Rok
Published in IEEE electron device letters (01.03.2014)
Published in IEEE electron device letters (01.03.2014)
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Journal Article
Vertical-Gate Si/SiGe Double-HBT-Based Capacitorless 1T DRAM Cell for Extended Retention Time at Low Latch Voltage
Shin, Ja Sun, Choi, Hyunjun, Bae, Hagyoul, Jang, Jaeman, Yun, Daeyoun, Hong, Euiyoun, Kim, Dae Hwan, Kim, Dong Myong
Published in IEEE electron device letters (01.02.2012)
Published in IEEE electron device letters (01.02.2012)
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Journal Article
Modeling and Separate Extraction of Gate-Bias- and Channel-Length-Dependent Intrinsic and Extrinsic Source-Drain Resistances in MOSFETs
Bae, Hagyoul, Jang, Jaeman, Shin, Ja Sun, Yun, Daeyoun, Lee, Jieun, Kim, Tae Wan, Kim, Dae Hwan, Kim, Dong Myong
Published in IEEE electron device letters (01.06.2011)
Published in IEEE electron device letters (01.06.2011)
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Journal Article
A Novel Double HBT-Based Capacitorless 1T DRAM Cell With Si/SiGe Heterojunctions
JA SUN SHIN, BAE, Hagyoul, JANG, Jaeman, YUN, Daeyoun, LEE, Jieun, HONG, Euiyoun, DAE HWAN KIM, DONG MYONG KIM
Published in IEEE electron device letters (01.07.2011)
Published in IEEE electron device letters (01.07.2011)
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Journal Article
Modeling and extraction technique for parasitic resistances in MOSFETs Combining DC I–V and low frequency C–V measurement
Shin, Ja Sun, Bae, Hagyoul, Hong, Euiyoun, Jang, Jaeman, Yun, Daeyoun, Lee, Jieun, Kim, Dae Hwan, Kim, Dong Myong
Published in Solid-state electronics (01.06.2012)
Published in Solid-state electronics (01.06.2012)
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Journal Article
Separate Extraction of Source, Drain, and Substrate Resistances in MOSFETs With Parasitic Junction Current Method
Bae, Hagyoul, Baek, Seok Cheon, Lee, Sunyeong, Jang, Jaeman, Shin, Ja Sun, Yun, Daeyoun, Kim, Hyojong, Kim, Dae Hwan, Kim, Dong Myong
Published in IEEE electron device letters (01.11.2010)
Published in IEEE electron device letters (01.11.2010)
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Journal Article
Differential Body-Factor Technique for Characterization of Interface Traps in MOSFETs
Yun, Daeyoun, Bae, Minkyung, Jang, Jaeman, Bae, Hagyoul, Shin, Ja Sun, Hong, Euiyeon, Lee, Jieun, Kim, Dae Hwan, Kim, Dong Myong
Published in IEEE electron device letters (01.09.2011)
Published in IEEE electron device letters (01.09.2011)
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Journal Article
Subbandgap Optical Differential Body-Factor Technique and Characterization of Interface States in SOI MOSFETs
EUIYOUN HONG, YUN, Daeyoun, DONG MYONG KIM, BAE, Hagyoul, HYUNJUN CHOI, WON HEE LEE, UHM, Mihee, SEO, Hyojoon, LEE, Jieun, JAEMAN JANG, DAE HWAN KIM
Published in IEEE electron device letters (01.07.2012)
Published in IEEE electron device letters (01.07.2012)
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Journal Article
A Novel Capacitorless DRAM Cell Using Superlattice Bandgap-Engineered (SBE) Structure With 30-nm Channel Length
LEE, Sunyeong, JA SUN SHIN, JANG, Jaeman, BAE, Hagyoul, YUN, Daeyoun, JIEUN LEE, DAE HWAN KIM, DONG MYONG KIM
Published in IEEE transactions on nanotechnology (01.09.2011)
Published in IEEE transactions on nanotechnology (01.09.2011)
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Journal Article
Analysis of Instability Mechanism under Simultaneous Positive Gate and Drain Bias Stress in Self-Aligned Top-Gate Amorphous Indium-Zinc-Oxide Thin-Film Transistors
Kim, Jonghwa, Choi, Sungju, Jang, Jaeman, Jang, Jun Tae, Kim, Jungmok, Choi, Sung-Jin, Kim, Dong Myong, Kim, Dae Hwan
Published in Journal of semiconductor technology and science (01.10.2015)
Published in Journal of semiconductor technology and science (01.10.2015)
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Journal Article
Characterization of Density-of-States in Polymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator
Kim, Jaehyeong, Jang, Jaeman, Bae, Minkyung, Lee, Jaewook, Kim, Woojoon, Hur, Inseok, Jeong, Hyun Kwang, Kim, Dong Myong, Kim, Dae Hwan
Published in Journal of semiconductor technology and science (01.02.2013)
Published in Journal of semiconductor technology and science (01.02.2013)
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Journal Article
Analysis of Instability Mechanism under Simultaneous Positive Gate and Drain Bias Stress in Self-Aligned Top-Gate Amorphous Indium-Zinc-Oxide Thin-Film Transistors
Kim, Jonghwa, Choi, Sungju, Jang, Jaeman, Jang, Jun Tae, Kim, Jungmok, Choi, Sung-Jin, Kim, Dong Myong, Kim, Dae Hwan
Published in Journal of semiconductor technology and science (2015)
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Published in Journal of semiconductor technology and science (2015)
Journal Article