Facial Emotion Recognition Analysis Based on Age-Biased Data
Park, Hyungjoo, Shin, Youngha, Song, Kyu, Yun, Channyeong, Jang, Dongyoung
Published in Applied sciences (01.08.2022)
Published in Applied sciences (01.08.2022)
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Journal Article
Covid Vaccine Risk Stratification
Standaert, Lucas, Munasinghe, Thilanka, Jang, Dongyoung, Tate, Catherine, Lossef, Sean, Wong, Wilson
Published in 2021 IEEE International Conference on Big Data (Big Data) (15.12.2021)
Published in 2021 IEEE International Conference on Big Data (Big Data) (15.12.2021)
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Conference Proceeding
7.1 A 1/4-inch 8Mpixel CMOS image sensor with 3D backside-illuminated 1.12μm pixel with front-side deep-trench isolation and vertical transfer gate
JungChak Ahn, Kyungho Lee, Yitae Kim, Heegeun Jeong, Bumsuk Kim, Hongki Kim, Jongeun Park, Taesub Jung, Wonje Park, Taeheon Lee, Eunkyung Park, Sangjun Choi, Gyehun Choi, Haeyong Park, Yujung Choi, Seungwook Lee, Yunkyung Kim, Jung, Y. Jay, Donghyuk Park, Seungjoo Nah, Youngsun Oh, Mihye Kim, Yooseung Lee, Youngwoo Chung, Hisanori, Ihara, Joonhyuk Im, Lee, Daniel K. J., Byunghyun Yim, GiDoo Lee, Heesang Kown, Sungho Choi, Jeonsook Lee, Dongyoung Jang, Youngchan Kim, Tae Chan Kim, Hiroshige, Goto, Chi-Young Choi, Duckhyung Lee, GabSoo Han
Published in 2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC) (01.02.2014)
Published in 2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC) (01.02.2014)
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Conference Proceeding
A Low-Voltage 0.7 µm Pixel with 6000 e- Full-Well Capacity for a Low-Power CMOS Image Sensor
Lee, Seung-Wook, Cha, Seungwon, Jang, Dongyoung, Kim, Mihye, Lee, Haewon, Lee, Nakyung, Kim, Seonok, Oh, Kwanyoung, Lee, Daehyung, Hong, SeungHan, Lee, Hana, Oh, Sunghoon, Park, Donghyuk, Kim, Yitae, Ahn, JungChak
Published in Electronic Imaging (18.01.2021)
Published in Electronic Imaging (18.01.2021)
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Journal Article
A 0.8 µm Smart Dual Conversion Gain Pixel for 64 Megapixels CMOS Image Sensor with 12k e- Full-Well Capacitance and Low Dark Noise
Park, Donghyuk, Joo, Woong, Lee, Yunki, Nah, Seungjoo, Jeong, Heegeun, Kim, Bumsuk, Jung, Sangil, Lee, Jesuk, Kim, Yitae, Moon, Chang-Rok, Park, Yongin, Lee, Seung-Wook, Han, Jinhwa, Jang, Dongyoung, Kwon, Heesang, Cha, Seungwon, Kim, Mihye, Lee, Haewon, Suh, Sungho
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
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Conference Proceeding