OFF-State Degradation of AlGaN/GaN Power HEMTs: Experimental Demonstration of Time-Dependent Drain-Source Breakdown
Meneghini, Matteo, Cibin, Giulia, Bertin, Marco, Hurkx, Godefridus Adrianus Maria, Ivo, Ponky, Sonsky, Jan, Croon, Jeroen A., Meneghesso, Gaudenzio, Zanoni, Enrico
Published in IEEE transactions on electron devices (01.06.2014)
Published in IEEE transactions on electron devices (01.06.2014)
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Journal Article
Modelling 2DEG charges in AlGaN/GaN heterostructures
Longobardi, G., Udrea, F., Sque, S., Croon, J., Hurkx, F., Napoli, E., Sonsky, J.
Published in CAS 2012 (International Semiconductor Conference) (01.10.2012)
Published in CAS 2012 (International Semiconductor Conference) (01.10.2012)
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Conference Proceeding
Investigation of surface charges and traps in gallium nitride/aluminium gallium nitride/gallium nitride high-voltage transistors via measurements and technology computer-aided design simulations of transfer characteristics of metal–insulator–semiconductor field-effect transistors and high-electron-mobility transistors
Longobardi, Giorgia, Udrea, Florin, Sque, Stephen, Croon, Jeroen, Hurkx, Fred, Šonský, Jan
Published in IET power electronics (01.12.2015)
Published in IET power electronics (01.12.2015)
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Journal Article
Extensive Investigation of Time-Dependent Breakdown of GaN-HEMTs Submitted to OFF-State Stress
Meneghini, Matteo, Rossetto, Isabella, Hurkx, Fred, Sonsky, Jan, Croon, Jeroen A., Meneghesso, Gaudenzio, Zanoni, Enrico
Published in IEEE transactions on electron devices (01.08.2015)
Published in IEEE transactions on electron devices (01.08.2015)
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Journal Article
Control of Buffer-Induced Current Collapse in AlGaN/GaN HEMTs Using SiNx Deposition
Waller, William M., Gajda, Mark, Pandey, Saurabh, Donkers, Johan J. T. M., Calton, David, Croon, Jeroen, Sonsky, Jan, Uren, Michael J., Kuball, Martin
Published in IEEE transactions on electron devices (01.10.2017)
Published in IEEE transactions on electron devices (01.10.2017)
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Journal Article
Impact of Silicon Nitride Stoichiometry on the Effectiveness of AlGaN/GaN HEMT Field Plates
Waller, William M., Gajda, Mark, Pandey, Saurabh, Donkers, Johan J. T. M., Calton, David, Croon, Jeroen, Karboyan, Serge, Sonsky, Jan, Uren, Michael J., Kuball, Martin
Published in IEEE transactions on electron devices (01.03.2017)
Published in IEEE transactions on electron devices (01.03.2017)
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Journal Article
The effect of the surface fixed charge and donor traps on the C(V) and transfer characteristics of a GaN MISFET - Experiment and TCAD simulations
Longobardi, Giorgia, Udrea, Florin, Sque, Stephen, Croon, Jeroen, Hurkx, Fred, Sonsky, Jan
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
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Conference Proceeding
Control of Buffer-Induced Current Collapse in AlGaN/GaN HEMTs Using SiN x Deposition
Waller, William M., Gajda, Mark, Pandey, Saurabh, Donkers, Johan J. T. M., Calton, David, Croon, Jeroen, Sonsky, Jan, Uren, Michael J., Kuball, Martin
Published in IEEE transactions on electron devices (01.10.2017)
Published in IEEE transactions on electron devices (01.10.2017)
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Journal Article
Subthreshold Mobility in AlGaN/GaN HEMTs
Waller, William M., Uren, Michael J., Kean Boon Lee, Houston, Peter A., Wallis, David J., Guiney, Ivor, Humphreys, Colin J., Pandey, Saurabh, Sonsky, Jan, Kuball, Martin
Published in IEEE transactions on electron devices (01.05.2016)
Published in IEEE transactions on electron devices (01.05.2016)
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Journal Article
A 65 nm CMOS 30 dBm Class-E RF Power Amplifier With 60% PAE and 40% PAE at 16 dB Back-Off
Apostolidou, M., van der Heijden, M.P., Leenaerts, D.M.W., Sonsky, J., Heringa, A., Volokhine, I.
Published in IEEE journal of solid-state circuits (01.05.2009)
Published in IEEE journal of solid-state circuits (01.05.2009)
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Conference Proceeding
Reverse-biased induced mechanical stress in AlGaN/GaN power diodes
Power, Maire, Kuball, Martin, Pomeroy, James W., Chatterjee, Indranil, Risbud, Dilip M., Wynne, Barry, Gajda, Mark A., Sonsky, Jan, Pedrotti, Kenneth D., Uren, Michael J.
Published in 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.06.2016)
Published in 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.06.2016)
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Conference Proceeding
Journal Article
The dynamics of surface donor traps in AlGaN/GaN MISFETs using transient measurements and TCAD modelling
Longobardi, Giorgia, Udrea, Florin, Sque, Stephen, Croon, Jeroen, Hurkx, Fred, Sonsky, Jan
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
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Conference Proceeding