Suspect Recommendation For Memory Devices
Barari, Adrita, Deshmukh, Shubham, Gupta, Ankit, Srivastava, Shwan, Jagannathachar, Keerthi Kiran, Kim, Young Yul
Published in 2023 IEEE Women in Technology Conference (WINTECHCON) (21.09.2023)
Published in 2023 IEEE Women in Technology Conference (WINTECHCON) (21.09.2023)
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Conference Proceeding
A scalable solution to AlphaZero based Redundancy Analysis for semiconductor chips
Thacker, Helik Kanti, Jujjarapu, Sairam, Barari, Adrita, Damini, Das, Paulami, Gupta, Sudhanshu, Patankar, Akhilesh Sudhir, Jagannathachar, Keerthi Kiran, Yoon, Deokgu
Published in 2022 21st IEEE International Conference on Machine Learning and Applications (ICMLA) (01.12.2022)
Published in 2022 21st IEEE International Conference on Machine Learning and Applications (ICMLA) (01.12.2022)
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Conference Proceeding
Identifying Combination of Defects and Unknown Defects on Semiconductor Wafers using Deep Learning and Hierarchical Reclustering
Gupta, Ankit, Barari, Adrita, Damini, Jagannathachar, Keerthi Kiran, Lee, Seungwoo, Oh, Janghoon, Kim, Jungha, Kim, Minjoo
Published in 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) (01.02.2022)
Published in 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) (01.02.2022)
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Conference Proceeding
Redundancy Analysis using Genetic Algorithm
Thacker, Helik Kanti, Kumar, Atishay, Gupta, Ankit, Jagannathachar, Keerthi Kiran, Yoon, Deokgu
Published in 2021 IEEE 18th India Council International Conference (INDICON) (19.12.2021)
Published in 2021 IEEE 18th India Council International Conference (INDICON) (19.12.2021)
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Conference Proceeding
A Deep Learning Model for Redundancy Analysis Algorithm Recommendation
Kumar, Atishay, Thacker, Helik Kanti, Gupta, Ankit, Jagannathachar, Keerthi Kiran, Yoon, Deokgu
Published in 2021 IEEE 18th India Council International Conference (INDICON) (19.12.2021)
Published in 2021 IEEE 18th India Council International Conference (INDICON) (19.12.2021)
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Conference Proceeding
AlphaRA: An AlphaZero based approach to Redundancy Analysis
Thacker, Helik Kanti, Kumar, Atishay, Barari, Adrita, Damini, Gupta, Ankit, Jagannathachar, Keerthi Kiran, Yoon, Deokgu
Published in 2021 20th IEEE International Conference on Machine Learning and Applications (ICMLA) (01.12.2021)
Published in 2021 20th IEEE International Conference on Machine Learning and Applications (ICMLA) (01.12.2021)
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Conference Proceeding
Method and system for repairing faulty cells of memory device
Yoon, Deokgu, Jagannathachar, Keerthi Kiran, Barari, Adrita, Kumar, Atishay, Gupta, Ankit, Damini, Thacker, Helik Kanti
Year of Publication 08.10.2024
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Year of Publication 08.10.2024
Patent
METHOD AND SYSTEM FOR REPAIRING FAULTY CELLS OF MEMORY DEVICE
Yoon, Deokgu, Jagannathachar, Keerthi Kiran, Barari, Adrita, Kumar, Atishay, Gupta, Ankit, Damini, Thacker, Helik Kanti
Year of Publication 19.01.2023
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Year of Publication 19.01.2023
Patent
METHODS AND ELECTRONIC DEVICE FOR REPAIRING MEMORY ELEMENT IN MEMORY DEVICE
JAGANNATHACHAR, Keerthi Kiran, PATANKAR, Akhilesh Sudhir, DAS, Paulami, THACKER, Helik Kanti, JUJJARAPU, Sairam, Damini, Damini, YOON, Deokgu, GUPTA, Sudhanshu, BARARI, Adrita
Year of Publication 11.01.2024
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Year of Publication 11.01.2024
Patent