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Published in Japanese Journal of Applied Physics (01.03.1998)
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Published in Journal of crystal growth (01.12.2000)
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Published in Applied surface science (09.10.2000)
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Verfahren und Vorrichtung zur in-situ Bestimmung der Temperatur eines Wafers
Zettler, Jörg-Thomas, Buick, Benjamin, Zettler, Johannes, Freudenberg, Alexander
Year of Publication 29.10.2020
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Year of Publication 29.10.2020
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Halbleiterbauelement aus einem oder mehreren Elementen der Gruppe-III mit Stickstoff
Dadgar, Armin, Kaspari, Christian, Tomita, Yuto, Zettler, Jörg-Thomas, Strittmatter, Andre, Berger, Christoph
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Year of Publication 08.12.2016
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