Changes in the Editorial Board
Uzsoy, Reha, Bickford, Jeanne, Natarajan, Mahadeva Iyer, Susto, Gian Antonio
Published in IEEE transactions on semiconductor manufacturing (01.08.2018)
Published in IEEE transactions on semiconductor manufacturing (01.08.2018)
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Journal Article
Physical Model for ESD Human Body Model to Transmission Line Pulse
Lee, Jian-Hsing, Mahadeva Iyer, Natarajan, Maloney, Timothy J.
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Engineering ESD Robust LDMOS SCR Devices in FinFET Technology
Lee, Jian-Hsing, Prabhu, Manjunatha, Natarajan, Mahadeva Iyer
Published in IEEE electron device letters (01.07.2018)
Published in IEEE electron device letters (01.07.2018)
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Journal Article
Advanced ESD power clamp design for SOI FinFET CMOS technology
Thijs, Steven, Tremouilles, David, Linten, Dimitri, Iyer, Natarajan Mahadeva, Griffoni, Alessio, Groeseneken, Guido
Published in 2010 IEEE International Conference on Integrated Circuit Design and Technology (01.06.2010)
Published in 2010 IEEE International Conference on Integrated Circuit Design and Technology (01.06.2010)
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Conference Proceeding
Editorial
Bickford, Jeanne P., Djurdjanovic, Dragan, Natarajan, Mahadeva Iyer
Published in IEEE transactions on semiconductor manufacturing (01.02.2024)
Published in IEEE transactions on semiconductor manufacturing (01.02.2024)
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Journal Article
Editorial
Bickford, Jeanne P., Djurdjanovic, Dragan, Natarajan, Mahadeva Iyer
Published in IEEE transactions on semiconductor manufacturing (01.02.2024)
Published in IEEE transactions on semiconductor manufacturing (01.02.2024)
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Journal Article
Influence of Skin Effect on the Current Distribution of Grounded-Gate NMOS Device
Jian-Hsing Lee, Iyer, Natarajan Mahadeva, Haojun Zhang
Published in IEEE electron device letters (01.11.2017)
Published in IEEE electron device letters (01.11.2017)
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Journal Article
ESD Robust Fully Salicided 5-V Integrated Power MOSFET in Submicron CMOS
Jian-Hsing Lee, Iyer, Natarajan Mahadeva, Prabhu, Manjunatha
Published in IEEE electron device letters (01.05.2017)
Published in IEEE electron device letters (01.05.2017)
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Journal Article
Wafer level high temperature reliability study by backside probing f or a 50um thin TSV wafer
Premachandran, C. S., Ranjan, Rakesh, Agarwal, Rahul, Yap Sing Fui, Paliwoda, Peter, Sarasvathi, Thangaraju, Arfa, Gondal, Patrick, Justison, Mahadeva Iyer, Natarajan
Published in 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) (01.05.2015)
Published in 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) (01.05.2015)
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Conference Proceeding
Tunable Holding-Voltage High Voltage ESD Devices
Lee, Jian-Hsing, Iyer, Natarajan Mahadeva
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Abnormal I/O failure caused by the HBM induced MM-like ESD event
Jain-Hsing Lee, Iyer, Natarajan Mahadeva
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
A 5-GHz fully integrated ESD-protected low-noise amplifier in 90-nm RF CMOS
Linten, D., Thijs, S., Natarajan, M.I., Wambacq, P., Jeamsaksiri, W., Ramos, J., Mercha, A., Jenei, S., Donnay, S., Decoutere, S.
Published in IEEE journal of solid-state circuits (01.07.2005)
Published in IEEE journal of solid-state circuits (01.07.2005)
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Journal Article
Conference Proceeding
New voltage controlled diode for power rail and regulator ESD protection
Jain-Hsing Lee, Iyer, Natarajan Mahadeva, Jain, Ruchil, Guowei Zhang, Prabhu, Manjunatha
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Printed-circuit board (PCB) charge induced product yield-loss during the final test
Jian-Hsing Lee, Takahashi, Kunihiko, Prabhu, Manjunatha, Natarajan, Mahadeva Iyer
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Methodology to achieve planar technology-like ESD performance in FINFET process
Jian-Hsing Lee, Prabhu, Manjunatha, Korablev, Konstantin, Singh, Jagar, Natarajan, Mahadeva Iyer, Pandey, Shesh Mani
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
A voltage base electrothermal model for the interconnection and E-Fuse under the DC and pulse stresses
Jian-Hsing Lee, Prabhu, Manjunatha, Iyer, Natarajan Mahadeva, Cheng-Hsu Wu, Chen-Hsin Lien
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
Analyze the ESD Performance and Bandwidth Difference for LC T-Network and Bridged T-Coil
Lee, Jian-Hsing, Nidhi, Karuna, Iyer, Natarajan Mahadeva
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding