Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance
Takeuchi, Kan, Shimada, Masaki, Konishi, Shinya, Oshida, Daisuke, Ota, Naoya, Yasumasu, Takashi, Shibutani, Koji, Iwashita, Tomohiro, Kokubun, Tetsuya, Tsuchiya, Fumio
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Get full text
Conference Proceeding
A 27% Active-Power-Reduced 40-nm CMOS Multimedia SoC With Adaptive Voltage Scaling Using Distributed Universal Delay Lines
Ikenaga, Y., Nomura, M., Suenaga, S., Sonohara, H., Horikoshi, Y., Saito, T., Ohdaira, Y., Nishio, Y., Iwashita, T., Satou, M., Nishida, K., Nose, K., Noguchi, K., Hayashi, Y., Mizuno, M.
Published in IEEE journal of solid-state circuits (01.04.2012)
Published in IEEE journal of solid-state circuits (01.04.2012)
Get full text
Journal Article
Conference Proceeding
Modeling of geological specimen by 3D printer
Kaneko, Naotomo, Uno, Hikaru, Iwashita, Tomohiro
Published in Chishitsu chōsa kenkyū hōkoku = Bulletin of the Geological Survey of Japan (15.12.2016)
Published in Chishitsu chōsa kenkyū hōkoku = Bulletin of the Geological Survey of Japan (15.12.2016)
Get full text
Journal Article