Radiation thermometry of silicon wafers based on emissivity-invariant condition
Iuchi, Tohru, Seo, Tomohiro
Published in Applied optics. Optical technology and biomedical optics (20.01.2011)
Published in Applied optics. Optical technology and biomedical optics (20.01.2011)
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Journal Article
New radiation thermometer for near room temperature
IUCHI, T, JONO, A
Published in Measurement : journal of the International Measurement Confederation (1995)
Published in Measurement : journal of the International Measurement Confederation (1995)
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Journal Article
Composition control in Hg1-xCdxTe growth by photoassisted MOCVD using an excimer laser
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Conference Proceeding
Journal Article
Semitransparent properties of an intrinsic silicon wafer and its application to an optical fiber temperature sensor
Terada, Daisuke, Takigawa, Ryusuke, Shimizu, Takao, Iuchi, Tohru
Published in 2016 55th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE) (01.09.2016)
Published in 2016 55th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE) (01.09.2016)
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Conference Proceeding
Non-contact temperature measurement for silicon wafers under 600 °C
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Conference Proceeding
OPTICAL THERMOMETER
IUCHI, TOHRU, YASHIRO, HIROKATSU, NAGATAKE, YOH-ICHI, KAWASAKI, ATSUSHI, NAKAMORI, YUKIO
Year of Publication 13.07.1989
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Year of Publication 13.07.1989
Patent
Composition control in Hg(1-x)Cd(x)Te growth by photoassisted MOCVD using an excimer laser
Terada, Toshiyuki, Fujita, Yasuhisa, Fujii, Satoshi, IUCHI, TOHRU
Published in Journal of crystal growth (01.02.1992)
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Published in Journal of crystal growth (01.02.1992)
Journal Article